Renner, E., Gaillard, Y., Richard, F., Amiot, F., & Delobelle, P. (2016). Sensitivity of the residual topography to single crystal plasticity parameters in Berkovich nanoindentation on FCC nickel. International Journal of Plasticity, 77, 118. https://doi.org/10.1016/j.ijplas.2015.10.002
Chicago Style (17th ed.) CitationRenner, E., Y. Gaillard, F. Richard, F. Amiot, and P. Delobelle. "Sensitivity of the Residual Topography to Single Crystal Plasticity Parameters in Berkovich Nanoindentation on FCC Nickel." International Journal of Plasticity 77 (2016): 118. https://doi.org/10.1016/j.ijplas.2015.10.002.
MLA (9th ed.) CitationRenner, E., et al. "Sensitivity of the Residual Topography to Single Crystal Plasticity Parameters in Berkovich Nanoindentation on FCC Nickel." International Journal of Plasticity, vol. 77, 2016, p. 118, https://doi.org/10.1016/j.ijplas.2015.10.002.