Interconnect reliability analysis of ULSI using automated model generation algorithm.
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| Title: | Interconnect reliability analysis of ULSI using automated model generation algorithm. |
|---|---|
| Authors: | Lin, Qian1,2, Fu, Haipeng1, Na, Weicong1, He, Feifei3, Li, Xi1, Cheng, Qianfu1, Zhu, Yuanyuan1 |
| Source: | International Journal of RF & Microwave Computer-Aided Engineering. Aug2016, Vol. 26 Issue 6, p481-488. 8p. 3 Diagrams, 2 Charts, 4 Graphs. |
| Subjects: | Integrated circuit interconnections, Computer reliability, Ultra large scale integration of circuits, Automation, Algorithms, Computer-aided engineering, Data analysis |
| Abstract: | ABSTRACT Fast interconnect reliability analysis is needed with the rapid development of ULSI (Ultra Large Scale Integration). Therefore, we aims to use the automated model generation (AMG) algorithm to analyze the ULSI reliability of metal interconnects. This is the first time to use the AMG algorithm in the field of IC reliability analysis. The AMG algorithm can achieve data generation automatically, determination of data distribution, adaptation of model structure, model training and testing. Using AMG algorithm in the reliability analysis, the number of the training data can be reduced by the adaptive sampling process and the incorporation of interpolation technique. This method can greatly improve the efficiency of the simulation and shorten the time for modeling than the existing manual neural network modeling methods. In this paper, we takes a power amplifier for example to validate the advantage of this technique. © 2016 Wiley Periodicals, Inc. Int J RF and Microwave CAE 26:481-488, 2016. [ABSTRACT FROM AUTHOR] |
| Copyright of International Journal of RF & Microwave Computer-Aided Engineering is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 116858060 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Interconnect reliability analysis of ULSI using automated model generation algorithm. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Lin%2C+Qian%22">Lin, Qian</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AR" term="%22Fu%2C+Haipeng%22">Fu, Haipeng</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Na%2C+Weicong%22">Na, Weicong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22He%2C+Feifei%22">He, Feifei</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Li%2C+Xi%22">Li, Xi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Cheng%2C+Qianfu%22">Cheng, Qianfu</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Zhu%2C+Yuanyuan%22">Zhu, Yuanyuan</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22International+Journal+of+RF+%26+Microwave+Computer-Aided+Engineering%22">International Journal of RF & Microwave Computer-Aided Engineering</searchLink>. Aug2016, Vol. 26 Issue 6, p481-488. 8p. 3 Diagrams, 2 Charts, 4 Graphs. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Integrated+circuit+interconnections%22">Integrated circuit interconnections</searchLink><br /><searchLink fieldCode="DE" term="%22Computer+reliability%22">Computer reliability</searchLink><br /><searchLink fieldCode="DE" term="%22Ultra+large+scale+integration+of+circuits%22">Ultra large scale integration of circuits</searchLink><br /><searchLink fieldCode="DE" term="%22Automation%22">Automation</searchLink><br /><searchLink fieldCode="DE" term="%22Algorithms%22">Algorithms</searchLink><br /><searchLink fieldCode="DE" term="%22Computer-aided+engineering%22">Computer-aided engineering</searchLink><br /><searchLink fieldCode="DE" term="%22Data+analysis%22">Data analysis</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: ABSTRACT Fast interconnect reliability analysis is needed with the rapid development of ULSI (Ultra Large Scale Integration). Therefore, we aims to use the automated model generation (AMG) algorithm to analyze the ULSI reliability of metal interconnects. This is the first time to use the AMG algorithm in the field of IC reliability analysis. The AMG algorithm can achieve data generation automatically, determination of data distribution, adaptation of model structure, model training and testing. Using AMG algorithm in the reliability analysis, the number of the training data can be reduced by the adaptive sampling process and the incorporation of interpolation technique. This method can greatly improve the efficiency of the simulation and shorten the time for modeling than the existing manual neural network modeling methods. In this paper, we takes a power amplifier for example to validate the advantage of this technique. © 2016 Wiley Periodicals, Inc. Int J RF and Microwave CAE 26:481-488, 2016. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of International Journal of RF & Microwave Computer-Aided Engineering is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/mmce.20992 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 481 Subjects: – SubjectFull: Integrated circuit interconnections Type: general – SubjectFull: Computer reliability Type: general – SubjectFull: Ultra large scale integration of circuits Type: general – SubjectFull: Automation Type: general – SubjectFull: Algorithms Type: general – SubjectFull: Computer-aided engineering Type: general – SubjectFull: Data analysis Type: general Titles: – TitleFull: Interconnect reliability analysis of ULSI using automated model generation algorithm. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Lin, Qian – PersonEntity: Name: NameFull: Fu, Haipeng – PersonEntity: Name: NameFull: Na, Weicong – PersonEntity: Name: NameFull: He, Feifei – PersonEntity: Name: NameFull: Li, Xi – PersonEntity: Name: NameFull: Cheng, Qianfu – PersonEntity: Name: NameFull: Zhu, Yuanyuan IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 08 Text: Aug2016 Type: published Y: 2016 Identifiers: – Type: issn-print Value: 10964290 Numbering: – Type: volume Value: 26 – Type: issue Value: 6 Titles: – TitleFull: International Journal of RF & Microwave Computer-Aided Engineering Type: main |
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