APA (7th ed.) Citation

Jeng, M., Xie, X., & Sheng-Luen Chung, L. (2004). ERCN* Merged Nets for Modeling Degraded Behavior and Parallel Processes in Semiconductor Manufacturing Systems. IEEE Transactions on Systems, Man & Cybernetics: Part A, 34(1), 102. https://doi.org/10.1109/TSMCA.2003.820579

Chicago Style (17th ed.) Citation

Jeng, MuDer, Xiaolan Xie, and Laura Sheng-Luen Chung. "ERCN* Merged Nets for Modeling Degraded Behavior and Parallel Processes in Semiconductor Manufacturing Systems." IEEE Transactions on Systems, Man & Cybernetics: Part A 34, no. 1 (2004): 102. https://doi.org/10.1109/TSMCA.2003.820579.

MLA (9th ed.) Citation

Jeng, MuDer, et al. "ERCN* Merged Nets for Modeling Degraded Behavior and Parallel Processes in Semiconductor Manufacturing Systems." IEEE Transactions on Systems, Man & Cybernetics: Part A, vol. 34, no. 1, 2004, p. 102, https://doi.org/10.1109/TSMCA.2003.820579.