APA (7th ed.) Citation

Touati, A., Bosio, A., Girard, P., Virazel, A., Bernardi, P., & Sonza Reorda, M. (2017). Microprocessor Testing: Functional Meets Structural Test. Journal of Circuits, Systems & Computers, 26(8), -1. https://doi.org/10.1142/S0218126617400072

Chicago Style (17th ed.) Citation

Touati, A., A. Bosio, P. Girard, A. Virazel, P. Bernardi, and M. Sonza Reorda. "Microprocessor Testing: Functional Meets Structural Test." Journal of Circuits, Systems & Computers 26, no. 8 (2017): -1. https://doi.org/10.1142/S0218126617400072.

MLA (9th ed.) Citation

Touati, A., et al. "Microprocessor Testing: Functional Meets Structural Test." Journal of Circuits, Systems & Computers, vol. 26, no. 8, 2017, pp. -1, https://doi.org/10.1142/S0218126617400072.