APA (7th ed.) Citation

Pin, S., Frémont, H., & Guédon-Gracia, A. (2017). Combined creep characterisation from single lap shear tests and 3D implementation for fatigue simulations. Microelectronics Reliability, 76, 368. https://doi.org/10.1016/j.microrel.2017.07.053

Chicago Style (17th ed.) Citation

Pin, S., H. Frémont, and A. Guédon-Gracia. "Combined Creep Characterisation from Single Lap Shear Tests and 3D Implementation for Fatigue Simulations." Microelectronics Reliability 76 (2017): 368. https://doi.org/10.1016/j.microrel.2017.07.053.

MLA (9th ed.) Citation

Pin, S., et al. "Combined Creep Characterisation from Single Lap Shear Tests and 3D Implementation for Fatigue Simulations." Microelectronics Reliability, vol. 76, 2017, p. 368, https://doi.org/10.1016/j.microrel.2017.07.053.