A test sequence selection method for statecharts.

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Title: A test sequence selection method for statecharts.
Authors: Hyoung Seok Hong1, Young Gon Kim1, Sung Deok Cha1, Doo Hwan Bae1, Ural, Hasan2
Source: Software Testing: Verification & Reliability. Dec2000, Vol. 10 Issue 4, p203-227. 25p.
Subjects: Statecharts (Computer science), Structured techniques of electronic data processing, Electronic data processing, Testing equipment, Data flow computing
Abstract: This paper presents a method for the selection of test sequences from statecharts. It is shown that a statechart can be transformed into a flow graph modelling the flow of both control and data in the statechart. The transformation enables the application of conventional control and data flow analysis techniques to test sequence selection from statecharts. The resulting set of test sequences provides the capability of determining whether an implementation establishes the desired flow of control and data expressed in statecharts. Copyright © 2000 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]
Copyright of Software Testing: Verification & Reliability is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: A test sequence selection method for statecharts.
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  Data: <searchLink fieldCode="JN" term="%22Software+Testing%3A+Verification+%26+Reliability%22">Software Testing: Verification & Reliability</searchLink>. Dec2000, Vol. 10 Issue 4, p203-227. 25p.
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  Data: <searchLink fieldCode="DE" term="%22Statecharts+%28Computer+science%29%22">Statecharts (Computer science)</searchLink><br /><searchLink fieldCode="DE" term="%22Structured+techniques+of+electronic+data+processing%22">Structured techniques of electronic data processing</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+data+processing%22">Electronic data processing</searchLink><br /><searchLink fieldCode="DE" term="%22Testing+equipment%22">Testing equipment</searchLink><br /><searchLink fieldCode="DE" term="%22Data+flow+computing%22">Data flow computing</searchLink>
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  Data: This paper presents a method for the selection of test sequences from statecharts. It is shown that a statechart can be transformed into a flow graph modelling the flow of both control and data in the statechart. The transformation enables the application of conventional control and data flow analysis techniques to test sequence selection from statecharts. The resulting set of test sequences provides the capability of determining whether an implementation establishes the desired flow of control and data expressed in statecharts. Copyright © 2000 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Software Testing: Verification & Reliability is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1002/1099-1689(200012)10:4<203::AID-STVR212>3.0.CO;2-2
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      – Code: eng
        Text: English
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        StartPage: 203
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      – SubjectFull: Statecharts (Computer science)
        Type: general
      – SubjectFull: Structured techniques of electronic data processing
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      – SubjectFull: Electronic data processing
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      – SubjectFull: Testing equipment
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      – SubjectFull: Data flow computing
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              M: 12
              Text: Dec2000
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              Y: 2000
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