APA (7th ed.) Citation

Gradwohl, K., Danilewsky, A. N., Roder, M., Schmidbauer, M., Janicskó-Csáthy, J., Gybin, A., . . . Sumathi, R. R. (2020). Dynamical X‐ray diffraction imaging of voids in dislocation‐free high‐purity germanium single crystals. Journal of Applied Crystallography, 53(4), 880. https://doi.org/10.1107/S1600576720005993

Chicago Style (17th ed.) Citation

Gradwohl, Kevin-P, Andreas N. Danilewsky, Melissa Roder, Martin Schmidbauer, József Janicskó-Csáthy, Alexander Gybin, Nikolay Abrosimov, and R. Radhakrishnan Sumathi. "Dynamical X‐ray Diffraction Imaging of Voids in Dislocation‐free High‐purity Germanium Single Crystals." Journal of Applied Crystallography 53, no. 4 (2020): 880. https://doi.org/10.1107/S1600576720005993.

MLA (9th ed.) Citation

Gradwohl, Kevin-P, et al. "Dynamical X‐ray Diffraction Imaging of Voids in Dislocation‐free High‐purity Germanium Single Crystals." Journal of Applied Crystallography, vol. 53, no. 4, 2020, p. 880, https://doi.org/10.1107/S1600576720005993.