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Dynamical X‐ray diffraction imaging of voids in dislocation‐free high‐purity germanium single crystals.

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Title: Dynamical X‐ray diffraction imaging of voids in dislocation‐free high‐purity germanium single crystals.
Authors: Gradwohl, Kevin-P.1 (AUTHOR), Danilewsky, Andreas N.2 (AUTHOR), Roder, Melissa2 (AUTHOR), Schmidbauer, Martin1 (AUTHOR), Janicskó-Csáthy, József1 (AUTHOR), Gybin, Alexander1 (AUTHOR), Abrosimov, Nikolay1 (AUTHOR), Sumathi, R. Radhakrishnan1 (AUTHOR) radhakrishnan.sumathi@ikz-berlin.de
Source: Journal of Applied Crystallography. Aug2020, Vol. 53 Issue 4, p880-884. 5p.
Subjects: Single crystals, X-ray imaging, Germanium, X-ray diffraction, X-ray topography, Dislocations in crystals, Voids (Crystallography), Dislocation density
Abstract: White‐beam X‐ray topography has been performed to provide direct evidence of micro‐voids in dislocation‐free high‐purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is shown that voids occur only in dislocation‐free parts of the crystal and do not show up in regions with homogeneous and moderate dislocation density. It is further suggested that the voids originate from clustering of vacancies during the growth process. A general method is proposed to verify the presence of voids for any crystalline material of high structural perfection. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 144931711
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Dynamical X‐ray diffraction imaging of voids in dislocation‐free high‐purity germanium single crystals.
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  Data: <searchLink fieldCode="DE" term="%22Single+crystals%22">Single crystals</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+imaging%22">X-ray imaging</searchLink><br /><searchLink fieldCode="DE" term="%22Germanium%22">Germanium</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+topography%22">X-ray topography</searchLink><br /><searchLink fieldCode="DE" term="%22Dislocations+in+crystals%22">Dislocations in crystals</searchLink><br /><searchLink fieldCode="DE" term="%22Voids+%28Crystallography%29%22">Voids (Crystallography)</searchLink><br /><searchLink fieldCode="DE" term="%22Dislocation+density%22">Dislocation density</searchLink>
– Name: Abstract
  Label: Abstract
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  Data: White‐beam X‐ray topography has been performed to provide direct evidence of micro‐voids in dislocation‐free high‐purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is shown that voids occur only in dislocation‐free parts of the crystal and do not show up in regions with homogeneous and moderate dislocation density. It is further suggested that the voids originate from clustering of vacancies during the growth process. A general method is proposed to verify the presence of voids for any crystalline material of high structural perfection. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – Type: doi
        Value: 10.1107/S1600576720005993
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      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 880
    Subjects:
      – SubjectFull: Single crystals
        Type: general
      – SubjectFull: X-ray imaging
        Type: general
      – SubjectFull: Germanium
        Type: general
      – SubjectFull: X-ray diffraction
        Type: general
      – SubjectFull: X-ray topography
        Type: general
      – SubjectFull: Dislocations in crystals
        Type: general
      – SubjectFull: Voids (Crystallography)
        Type: general
      – SubjectFull: Dislocation density
        Type: general
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      – TitleFull: Dynamical X‐ray diffraction imaging of voids in dislocation‐free high‐purity germanium single crystals.
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            – D: 01
              M: 08
              Text: Aug2020
              Type: published
              Y: 2020
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