APA (7th ed.) Citation

Deppe, D., Leshin, J., Eifert, L., Tucker, F., & Hillyer, T. (2017). Transverse mode confinement in lithographic VCSELs. Electronics Letters (Wiley-Blackwell), 53(23), 1598. https://doi.org/10.1049/el.2017.2780

Chicago Style (17th ed.) Citation

Deppe, D.G, J. Leshin, L. Eifert, F. Tucker, and T. Hillyer. "Transverse Mode Confinement in Lithographic VCSELs." Electronics Letters (Wiley-Blackwell) 53, no. 23 (2017): 1598. https://doi.org/10.1049/el.2017.2780.

MLA (9th ed.) Citation

Deppe, D.G, et al. "Transverse Mode Confinement in Lithographic VCSELs." Electronics Letters (Wiley-Blackwell), vol. 53, no. 23, 2017, p. 1598, https://doi.org/10.1049/el.2017.2780.