Sharshunov, S. G. (2004). Functional Tests for RISC-microprocessors. Automation & Remote Control, 65(11), 1847. https://doi.org/10.1023/B:AURC.0000047898.43514.d0
Chicago Style (17th ed.) CitationSharshunov, S. G. "Functional Tests for RISC-microprocessors." Automation & Remote Control 65, no. 11 (2004): 1847. https://doi.org/10.1023/B:AURC.0000047898.43514.d0.
MLA (9th ed.) CitationSharshunov, S. G. "Functional Tests for RISC-microprocessors." Automation & Remote Control, vol. 65, no. 11, 2004, p. 1847, https://doi.org/10.1023/B:AURC.0000047898.43514.d0.
Warning: These citations may not always be 100% accurate.