FOCUS: fast Monte Carlo approach to coherence of undulator sources.
Saved in:
| Title: | FOCUS: fast Monte Carlo approach to coherence of undulator sources. |
|---|---|
| Authors: | Siano, M.1 mirko.siano@unimi.it, Geloni, G.2, Paroli, B.1, Butti, D.3, Lefèvre, T.3, Mazzoni, S.3, Trad, G.3, Iriso, U.4, Nosych, A. A.4, Torino, L.4, Potenza, M. A. C.1 |
| Source: | Journal of Synchrotron Radiation. Jan2023, Vol. 30 Issue 1, p217-226. 10p. |
| Subjects: | Undulator radiation, Synchrotron radiation, Free electron lasers, Relativistic electrons, Fourier transform optics, Electric fields, Graphics processing units |
| Abstract: | FOCUS (Fast Monte CarlO approach to Coherence of Undulator Sources) is a new GPU-based simulation code to compute the transverse coherence of undulator radiation from ultra-relativistic electrons. The core structure of the code, which is written in the language C++ accelerated with CUDA, combines an analytical description of the emitted electric fields and massively parallel computations on GPUs. The combination is rigorously justified by a statistical description of synchrotron radiation based on a Fourier optics approach. FOCUS is validated by direct comparison with multi-electron Synchrotron Radiation Workshop (SRW) simulations, evidencing a reduction in computation times by up to five orders of magnitude on a consumer laptop. FOCUS is then applied to systematically study the transverse coherence in typical third- and fourth-generation facilities, highlighting peculiar features of undulator sources close to the diffraction limit. FOCUS is aimed at fast evaluation of the transverse coherence of undulator radiation as a function of the electron beam parameters, to support and help prepare more advanced and detailed numerical simulations with traditional codes like SRW. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
Be the first to leave a comment!
