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Investigation of Potential‐Induced Degradation and Recovery in Perovskite Minimodules.

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Title: Investigation of Potential‐Induced Degradation and Recovery in Perovskite Minimodules.
Authors: Zhang, Junchuan1,2 (AUTHOR), Wu, Haodong1,3 (AUTHOR), Zhang, Yi4 (AUTHOR), Cao, Fangfang1,3 (AUTHOR), Qiu, Zhiheng1,2 (AUTHOR), Li, Minghui1,3 (AUTHOR), Lang, Xiting1 (AUTHOR), Jiang, Yongjie1,2 (AUTHOR), Gou, Yangyang1 (AUTHOR), Liu, Xirui1,3 (AUTHOR), Asiri, Abdullah M.5 (AUTHOR), Dyson, Paul J.4 (AUTHOR), Nazeeruddin, Mohammad Khaja4 (AUTHOR) mdkhaja.nazeeruddin@epfl.ch, Ye, Jichun1 (AUTHOR) jichun.ye@nimte.ac.cn, Xiao, Chuanxiao1,6 (AUTHOR) cxiao@nimte.ac.cn
Source: Progress in Photovoltaics. Dec2024, Vol. 32 Issue 12, p941-949. 9p.
Subjects: Radiant intensity, Crystal grain boundaries, Perovskite, Photoluminescence, Ions
Abstract: Potential‐induced degradation (PID) is a prevalent concern in current commercial photovoltaic technologies, impacting their reliability, with the mechanistic basis for PID in perovskite photovoltaic technologies being poorly understood. Here, we investigate the PID mechanism in perovskite minimodules. Our findings reveal nonuniform degradation in the photoluminescence intensity and spectral blue shift. After 60‐h laboratory PID stress tests at −1500 V and 60°C, device efficiency drastically decreases by 96%, and the shunt resistance decreases by 97%, accompanied by a significant quantity of Na+ ions (derived from the soda lime glass) throughout the device structure, leading to a typical PID‐shunting effect. Interestingly, we observed a rapid recovery of device performance during room‐temperature dark storage, in which Na+ ions located close to the glass substrate side rapidly migrated out of the device. Moreover, we also found that the Na+ ions do not appear to diffuse through the grain boundaries but rather their neighboring area and grain interiors, judging by microscopic conductivity mappings. [ABSTRACT FROM AUTHOR]
Copyright of Progress in Photovoltaics is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Investigation of Potential‐Induced Degradation and Recovery in Perovskite Minimodules.
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  Data: <searchLink fieldCode="AR" term="%22Zhang%2C+Junchuan%22">Zhang, Junchuan</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wu%2C+Haodong%22">Wu, Haodong</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhang%2C+Yi%22">Zhang, Yi</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Cao%2C+Fangfang%22">Cao, Fangfang</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Qiu%2C+Zhiheng%22">Qiu, Zhiheng</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Li%2C+Minghui%22">Li, Minghui</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Lang%2C+Xiting%22">Lang, Xiting</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jiang%2C+Yongjie%22">Jiang, Yongjie</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Gou%2C+Yangyang%22">Gou, Yangyang</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Liu%2C+Xirui%22">Liu, Xirui</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Asiri%2C+Abdullah+M%2E%22">Asiri, Abdullah M.</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Dyson%2C+Paul+J%2E%22">Dyson, Paul J.</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Nazeeruddin%2C+Mohammad+Khaja%22">Nazeeruddin, Mohammad Khaja</searchLink><relatesTo>4</relatesTo> (AUTHOR)<i> mdkhaja.nazeeruddin@epfl.ch</i><br /><searchLink fieldCode="AR" term="%22Ye%2C+Jichun%22">Ye, Jichun</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> jichun.ye@nimte.ac.cn</i><br /><searchLink fieldCode="AR" term="%22Xiao%2C+Chuanxiao%22">Xiao, Chuanxiao</searchLink><relatesTo>1,6</relatesTo> (AUTHOR)<i> cxiao@nimte.ac.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22Progress+in+Photovoltaics%22">Progress in Photovoltaics</searchLink>. Dec2024, Vol. 32 Issue 12, p941-949. 9p.
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– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Potential‐induced degradation (PID) is a prevalent concern in current commercial photovoltaic technologies, impacting their reliability, with the mechanistic basis for PID in perovskite photovoltaic technologies being poorly understood. Here, we investigate the PID mechanism in perovskite minimodules. Our findings reveal nonuniform degradation in the photoluminescence intensity and spectral blue shift. After 60‐h laboratory PID stress tests at −1500 V and 60°C, device efficiency drastically decreases by 96%, and the shunt resistance decreases by 97%, accompanied by a significant quantity of Na+ ions (derived from the soda lime glass) throughout the device structure, leading to a typical PID‐shunting effect. Interestingly, we observed a rapid recovery of device performance during room‐temperature dark storage, in which Na+ ions located close to the glass substrate side rapidly migrated out of the device. Moreover, we also found that the Na+ ions do not appear to diffuse through the grain boundaries but rather their neighboring area and grain interiors, judging by microscopic conductivity mappings. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Progress in Photovoltaics is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1002/pip.3848
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        Text: English
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        PageCount: 9
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      – SubjectFull: Radiant intensity
        Type: general
      – SubjectFull: Crystal grain boundaries
        Type: general
      – SubjectFull: Perovskite
        Type: general
      – SubjectFull: Photoluminescence
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      – SubjectFull: Ions
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      – TitleFull: Investigation of Potential‐Induced Degradation and Recovery in Perovskite Minimodules.
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              M: 12
              Text: Dec2024
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