Henderson, J., Pearson, L., Nie, H., & Biesinger, M. (2025). X‐Ray Photoelectron Spectroscopy Analysis of Indium and Indium‐Containing Compounds. Surface & Interface Analysis: SIA, 57(1), 81. https://doi.org/10.1002/sia.7356
Chicago Style (17th ed.) CitationHenderson, Jeffrey D, Laurel Pearson, Heng‐Yong Nie, and Mark C Biesinger. "X‐Ray Photoelectron Spectroscopy Analysis of Indium and Indium‐Containing Compounds." Surface & Interface Analysis: SIA 57, no. 1 (2025): 81. https://doi.org/10.1002/sia.7356.
MLA (9th ed.) CitationHenderson, Jeffrey D, et al. "X‐Ray Photoelectron Spectroscopy Analysis of Indium and Indium‐Containing Compounds." Surface & Interface Analysis: SIA, vol. 57, no. 1, 2025, p. 81, https://doi.org/10.1002/sia.7356.
Warning: These citations may not always be 100% accurate.