X‐Ray Photoelectron Spectroscopy Analysis of Indium and Indium‐Containing Compounds.
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| Title: | X‐Ray Photoelectron Spectroscopy Analysis of Indium and Indium‐Containing Compounds. |
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| Authors: | Henderson, Jeffrey D.1 (AUTHOR) jhende64@uwo.ca, Pearson, Laurel1,2 (AUTHOR), Nie, Heng‐Yong1,3 (AUTHOR), Biesinger, Mark C.1,2 (AUTHOR) biesingr@uwo.ca |
| Source: | Surface & Interface Analysis: SIA. Jan2025, Vol. 57 Issue 1, p81-97. 17p. |
| Subjects: | Photoelectron spectroscopy, Indium compounds, Mass spectrometry, Counter-ions, Binding energy |
| Abstract: | X‐ray photoelectron spectroscopy (XPS) is widely employed across various research fields due to its surface and chemical sensitivity. However, accurate interpretation poses a challenge due to the lack of comprehensive reference data in the literature, leading to misinterpretation, especially among novice users. Analyzing the chemical state of indium and indium‐containing compounds is particularly challenging due to subtle shifts in the binding energies of the commonly used 3d core line. This paper presents and discusses a collection of reference data, including the In 3d, In 3p, In 4d, In MNN, and relevant counter ion signals. Additionally, it explores other useful information such as the modified Auger parameter and Wagner (or chemical state) plots. The utility of X‐ray–induced Auger electrons is demonstrated in the speciation of mixed systems. [ABSTRACT FROM AUTHOR] |
| Copyright of Surface & Interface Analysis: SIA is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 181226864 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: X‐Ray Photoelectron Spectroscopy Analysis of Indium and Indium‐Containing Compounds. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Henderson%2C+Jeffrey D%2E%22">Henderson, Jeffrey D.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> jhende64@uwo.ca</i><br /><searchLink fieldCode="AR" term="%22Pearson%2C+Laurel%22">Pearson, Laurel</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Nie%2C+Heng‐Yong%22">Nie, Heng‐Yong</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Biesinger%2C+Mark C%2E%22">Biesinger, Mark C.</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> biesingr@uwo.ca</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Surface+%26+Interface+Analysis%3A+SIA%22">Surface & Interface Analysis: SIA</searchLink>. Jan2025, Vol. 57 Issue 1, p81-97. 17p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Photoelectron+spectroscopy%22">Photoelectron spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Indium+compounds%22">Indium compounds</searchLink><br /><searchLink fieldCode="DE" term="%22Mass+spectrometry%22">Mass spectrometry</searchLink><br /><searchLink fieldCode="DE" term="%22Counter-ions%22">Counter-ions</searchLink><br /><searchLink fieldCode="DE" term="%22Binding+energy%22">Binding energy</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: X‐ray photoelectron spectroscopy (XPS) is widely employed across various research fields due to its surface and chemical sensitivity. However, accurate interpretation poses a challenge due to the lack of comprehensive reference data in the literature, leading to misinterpretation, especially among novice users. Analyzing the chemical state of indium and indium‐containing compounds is particularly challenging due to subtle shifts in the binding energies of the commonly used 3d core line. This paper presents and discusses a collection of reference data, including the In 3d, In 3p, In 4d, In MNN, and relevant counter ion signals. Additionally, it explores other useful information such as the modified Auger parameter and Wagner (or chemical state) plots. The utility of X‐ray–induced Auger electrons is demonstrated in the speciation of mixed systems. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Surface & Interface Analysis: SIA is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/sia.7356 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 17 StartPage: 81 Subjects: – SubjectFull: Photoelectron spectroscopy Type: general – SubjectFull: Indium compounds Type: general – SubjectFull: Mass spectrometry Type: general – SubjectFull: Counter-ions Type: general – SubjectFull: Binding energy Type: general Titles: – TitleFull: X‐Ray Photoelectron Spectroscopy Analysis of Indium and Indium‐Containing Compounds. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Henderson, Jeffrey D. – PersonEntity: Name: NameFull: Pearson, Laurel – PersonEntity: Name: NameFull: Nie, Heng‐Yong – PersonEntity: Name: NameFull: Biesinger, Mark C. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: Jan2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 01422421 Numbering: – Type: volume Value: 57 – Type: issue Value: 1 Titles: – TitleFull: Surface & Interface Analysis: SIA Type: main |
| ResultId | 1 |
