APA (7th ed.) Citation

Cao, H., Zhao, D., Hu, T., Zheng, Y., Bai, W., Chen, Y., . . . Chu, J. (2025). Identification and Mitigation Strategies of Etch Pit-Associated Defects in MBE-Grown HgCdTe Thin Films: Identification and Mitigation Strategies of Etch-pit-associated: H. Cao et al. Journal of Electronic Materials, 54(4), 2913. https://doi.org/10.1007/s11664-025-11772-3

Chicago Style (17th ed.) Citation

Cao, Hechun, et al. "Identification and Mitigation Strategies of Etch Pit-Associated Defects in MBE-Grown HgCdTe Thin Films: Identification and Mitigation Strategies of Etch-pit-associated: H. Cao Et Al." Journal of Electronic Materials 54, no. 4 (2025): 2913. https://doi.org/10.1007/s11664-025-11772-3.

MLA (9th ed.) Citation

Cao, Hechun, et al. "Identification and Mitigation Strategies of Etch Pit-Associated Defects in MBE-Grown HgCdTe Thin Films: Identification and Mitigation Strategies of Etch-pit-associated: H. Cao Et Al." Journal of Electronic Materials, vol. 54, no. 4, 2025, p. 2913, https://doi.org/10.1007/s11664-025-11772-3.