An Experimental Study for the Effects of Noise on Pattern Recognition Algorithms.
Saved in:
| Title: | An Experimental Study for the Effects of Noise on Pattern Recognition Algorithms. |
|---|---|
| Authors: | Guang Yi Chen1 guang_c@cse.concordia.ca, Krzyzak, Adam2 krzyzak@cse.concordia.ca |
| Source: | Engineering Letters. May2025, Vol. 33 Issue 5, p1185-1192. 8p. |
| Subjects: | Pattern recognition systems, Additive white Gaussian noise, Fast Fourier transforms, Discrete wavelet transforms, Central processing units |
| Abstract: | Pattern recognition is a very important topic in computer vision. Among existing methods, which one is the most robust to noise? This is a very interesting question to answer. In this paper, we compare fifteen different methods for pattern recognition under different noise levels and different rotation angles. Most of these methods are invariant to translation, rotation, and scaling of the pattern images. Our experiments demonstrate that the Ridgelet + FFT (fast Fourier transform) descriptor is the most robust to additive Gaussian white noise (AGWN) for both a printed Chinese character dataset and an aircraft dataset. In addition, the Zernike moments and the Radon transform + FFT2 descriptor are also relatively robust to noise, but they are not as good as the Ridgelet + FFT descriptor for pattern recognition. We also compare the CPU (central processing units) computational time for all these methods for both pattern datasets. [ABSTRACT FROM AUTHOR] |
| Copyright of Engineering Letters is the property of International Association of Engineers (IAENG) and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
|---|---|
| Header | DbId: egs DbLabel: Engineering Source An: 185023769 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: An Experimental Study for the Effects of Noise on Pattern Recognition Algorithms. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Guang+Yi+Chen%22">Guang Yi Chen</searchLink><relatesTo>1</relatesTo><i> guang_c@cse.concordia.ca</i><br /><searchLink fieldCode="AR" term="%22Krzyzak%2C+Adam%22">Krzyzak, Adam</searchLink><relatesTo>2</relatesTo><i> krzyzak@cse.concordia.ca</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Engineering+Letters%22">Engineering Letters</searchLink>. May2025, Vol. 33 Issue 5, p1185-1192. 8p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Pattern+recognition+systems%22">Pattern recognition systems</searchLink><br /><searchLink fieldCode="DE" term="%22Additive+white+Gaussian+noise%22">Additive white Gaussian noise</searchLink><br /><searchLink fieldCode="DE" term="%22Fast+Fourier+transforms%22">Fast Fourier transforms</searchLink><br /><searchLink fieldCode="DE" term="%22Discrete+wavelet+transforms%22">Discrete wavelet transforms</searchLink><br /><searchLink fieldCode="DE" term="%22Central+processing+units%22">Central processing units</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Pattern recognition is a very important topic in computer vision. Among existing methods, which one is the most robust to noise? This is a very interesting question to answer. In this paper, we compare fifteen different methods for pattern recognition under different noise levels and different rotation angles. Most of these methods are invariant to translation, rotation, and scaling of the pattern images. Our experiments demonstrate that the Ridgelet + FFT (fast Fourier transform) descriptor is the most robust to additive Gaussian white noise (AGWN) for both a printed Chinese character dataset and an aircraft dataset. In addition, the Zernike moments and the Radon transform + FFT2 descriptor are also relatively robust to noise, but they are not as good as the Ridgelet + FFT descriptor for pattern recognition. We also compare the CPU (central processing units) computational time for all these methods for both pattern datasets. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Engineering Letters is the property of International Association of Engineers (IAENG) and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=185023769 |
| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 1185 Subjects: – SubjectFull: Pattern recognition systems Type: general – SubjectFull: Additive white Gaussian noise Type: general – SubjectFull: Fast Fourier transforms Type: general – SubjectFull: Discrete wavelet transforms Type: general – SubjectFull: Central processing units Type: general Titles: – TitleFull: An Experimental Study for the Effects of Noise on Pattern Recognition Algorithms. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Guang Yi Chen – PersonEntity: Name: NameFull: Krzyzak, Adam IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 1816093X Numbering: – Type: volume Value: 33 – Type: issue Value: 5 Titles: – TitleFull: Engineering Letters Type: main |
| ResultId | 1 |