Li, C., Zhu, C., Wang, W., & Shi, A. (2022). Repairing order-dependent flaky tests via test generation. ICSE: International Conference on Software Engineering, 1881. https://doi.org/10.1145/3510003.3510173
Chicago Style (17th ed.) CitationLi, Chengpeng, Chenguang Zhu, Wenxi Wang, and August Shi. "Repairing Order-dependent Flaky Tests via Test Generation." ICSE: International Conference on Software Engineering 2022: 1881. https://doi.org/10.1145/3510003.3510173.
MLA (9th ed.) CitationLi, Chengpeng, et al. "Repairing Order-dependent Flaky Tests via Test Generation." ICSE: International Conference on Software Engineering, 2022, p. 1881, https://doi.org/10.1145/3510003.3510173.
Warning: These citations may not always be 100% accurate.