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Analysis of micromorphological evolution of lead-free solder joints under random vibration.

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Title: Analysis of micromorphological evolution of lead-free solder joints under random vibration.
Authors: Wang, Fusheng (AUTHOR) fswang@cauc.edu.cn, Gao, Hongying (AUTHOR) 2023012148@cauc.edu.cn, Xiao, Zewen (AUTHOR) zxc552416028@163.com, Chen, Yajun (AUTHOR) yjchen@cauc.edu.cn
Source: Soldering & Surface Mount Technology. 2025, Vol. 37 Issue 5, p377-385. 9p.
Subjects: Lead-free solder, Random vibration, Engineering reliability theory, Material fatigue, Microstructure, Alloy fatigue, Intermetallic compounds
Abstract: Purpose: The purpose of this study is to investigate the fatigue failure process of the Sn-3Ag-0.5Cu alloy (SAC305) under vehicle vibration conditions and to analyze the microstructural changes in the material over varying vibration durations. Given that SAC305 is a widely used lead-free solder, examining its reliability in operational environments holds practical significance. Design/methodology/approach: In this paper, the solder joints with SAC305 alloy as the material are discussed. The random vibration test of the product-level Ball Grid Array Package chip is carried out with the test parameters in ISO-16750-3. The failure process of the solder joints under actual working conditions is simulated, and the microstructure changes of the solder joints and their influence on the reliability of the materials are explored. Findings: The intermetallic compound (IMC) layer of the solder joint has an initial thickness. Within the first 36 h of vibration, this thickness decreases due to changes in the growth mode of the IMCs. After 36 h, however, the thickness of the IMC in the solder joint begins to increase as the duration of vibration extends, leading to a change in the failure mode of the solder joint. Electron Backscatter Diffraction analysis revealed that the IMC of the solder joint precipitated fine grains. Ultimately, the results of the solder joint thrust test indicated that the thrust of the solder joint is more closely correlated with the IMC thickness than with the grain refinement of the IMC layer. Originality/value: In this study, the solder joints of SAC305 material have more frequent vibration shocks in the working environment of the on-board chip, and the mechanical damage test caused by random vibration is less than the temperature shock test. It is of practical significance to explore the failure problem of solder joints under mechanical fatigue load. [ABSTRACT FROM AUTHOR]
Copyright of Soldering & Surface Mount Technology is the property of Emerald Publishing Limited and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 187531374
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Analysis of micromorphological evolution of lead-free solder joints under random vibration.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Wang%2C+Fusheng%22">Wang, Fusheng</searchLink> (AUTHOR)<i> fswang@cauc.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Gao%2C+Hongying%22">Gao, Hongying</searchLink> (AUTHOR)<i> 2023012148@cauc.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Xiao%2C+Zewen%22">Xiao, Zewen</searchLink> (AUTHOR)<i> zxc552416028@163.com</i><br /><searchLink fieldCode="AR" term="%22Chen%2C+Yajun%22">Chen, Yajun</searchLink> (AUTHOR)<i> yjchen@cauc.edu.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22Soldering+%26+Surface+Mount+Technology%22">Soldering & Surface Mount Technology</searchLink>. 2025, Vol. 37 Issue 5, p377-385. 9p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Lead-free+solder%22">Lead-free solder</searchLink><br /><searchLink fieldCode="DE" term="%22Random+vibration%22">Random vibration</searchLink><br /><searchLink fieldCode="DE" term="%22Engineering+reliability+theory%22">Engineering reliability theory</searchLink><br /><searchLink fieldCode="DE" term="%22Material+fatigue%22">Material fatigue</searchLink><br /><searchLink fieldCode="DE" term="%22Microstructure%22">Microstructure</searchLink><br /><searchLink fieldCode="DE" term="%22Alloy+fatigue%22">Alloy fatigue</searchLink><br /><searchLink fieldCode="DE" term="%22Intermetallic+compounds%22">Intermetallic compounds</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Purpose: The purpose of this study is to investigate the fatigue failure process of the Sn-3Ag-0.5Cu alloy (SAC305) under vehicle vibration conditions and to analyze the microstructural changes in the material over varying vibration durations. Given that SAC305 is a widely used lead-free solder, examining its reliability in operational environments holds practical significance. Design/methodology/approach: In this paper, the solder joints with SAC305 alloy as the material are discussed. The random vibration test of the product-level Ball Grid Array Package chip is carried out with the test parameters in ISO-16750-3. The failure process of the solder joints under actual working conditions is simulated, and the microstructure changes of the solder joints and their influence on the reliability of the materials are explored. Findings: The intermetallic compound (IMC) layer of the solder joint has an initial thickness. Within the first 36 h of vibration, this thickness decreases due to changes in the growth mode of the IMCs. After 36 h, however, the thickness of the IMC in the solder joint begins to increase as the duration of vibration extends, leading to a change in the failure mode of the solder joint. Electron Backscatter Diffraction analysis revealed that the IMC of the solder joint precipitated fine grains. Ultimately, the results of the solder joint thrust test indicated that the thrust of the solder joint is more closely correlated with the IMC thickness than with the grain refinement of the IMC layer. Originality/value: In this study, the solder joints of SAC305 material have more frequent vibration shocks in the working environment of the on-board chip, and the mechanical damage test caused by random vibration is less than the temperature shock test. It is of practical significance to explore the failure problem of solder joints under mechanical fatigue load. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Soldering & Surface Mount Technology is the property of Emerald Publishing Limited and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1108/SSMT-02-2025-0009
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 9
        StartPage: 377
    Subjects:
      – SubjectFull: Lead-free solder
        Type: general
      – SubjectFull: Random vibration
        Type: general
      – SubjectFull: Engineering reliability theory
        Type: general
      – SubjectFull: Material fatigue
        Type: general
      – SubjectFull: Microstructure
        Type: general
      – SubjectFull: Alloy fatigue
        Type: general
      – SubjectFull: Intermetallic compounds
        Type: general
    Titles:
      – TitleFull: Analysis of micromorphological evolution of lead-free solder joints under random vibration.
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            NameFull: Wang, Fusheng
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            NameFull: Gao, Hongying
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            NameFull: Xiao, Zewen
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            NameFull: Chen, Yajun
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            – D: 01
              M: 08
              Text: 2025
              Type: published
              Y: 2025
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              Value: 37
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            – TitleFull: Soldering & Surface Mount Technology
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