The effect of (In3+, Ta5+) co-dopant on dielectric properties and nonlinear characteristics of Bi2/3Cu3Ti4O12 ceramics.
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| Title: | The effect of (In3+, Ta5+) co-dopant on dielectric properties and nonlinear characteristics of Bi2/3Cu3Ti4O12 ceramics. |
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| Authors: | Yang, Longhai1,2 (AUTHOR) ylonghai@hotmail.com, Chen, Shijie1,2 (AUTHOR), Gao, Wenjie1,2 (AUTHOR), Wu, Fengjuan1,2 (AUTHOR), Zhang, Jingyuan1,2 (AUTHOR), Zhang, Tao1,3 (AUTHOR) tzhang@xust.edu.cn |
| Source: | Ceramics International. Nov2025:Part C, Vol. 51 Issue 26, p50975-50984. 10p. |
| Subjects: | Dielectric properties, Nonlinear mechanics, Doping agents (Chemistry), Impedance spectroscopy, Tantalum, Ceramics, Ceramic materials |
| Abstract: | Bi 2/3 Cu 3 Ti 4 O 12 , Bi 2/3 Cu 3 Ti 3.995 In 0.005 O 12 , Bi 2/3 Cu 3 Ti 3.995 Ta 0.005 O 12 , and Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 (x = 0.005, 0.01, 0.02, 0.04, and 0.08) ceramics were successfully prepared using traditional solid-phase methods. At 1 kHz, the dielectric constant and dielectric loss of all samples are 54902 and 0.3345 (Bi 2/3 Cu 3 Ti 4 O 12), 62501 and 0.3152 (Bi 2/3 Cu 3 Ti 3.995 In 0.005 O 12), 1100.2 and 0.2325 (Bi 2/3 Cu 3 Ti 3.995 Ta 0.005 O 12), 857.95 and 0.212 (Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 with x = 0.005), 3789.6 and 0.3145 (Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 with x = 0.01), 75505 and 0.1079 (Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 with x = 0.02), 80511 and 0.095 (Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 with x = 0.04), and 67487 and 0.1142 (Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 with x = 0.08), respectively. The dielectric constant gradually increases with the increase in co-doping amount, while the dielectric loss decreases. High breakdown field strength (E b = 10.37 kV/cm) and high nonlinearity coefficient (α = 5.7) are obtained for x = 0.005. The dielectric constant and dielectric loss of different sputtered electrodes were measured to confirm that electrodes have an effect across the entire frequency band investigated. The analysis of the complex impedance spectra indicates that the colossal dielectric permittivity observed in the mid-frequency range for all ceramic samples can be attributed to the internal barrier layer capacitance effect. The lattice constants, Cu–O bond lengths, Ti–O bond lengths, and Ti–O–Ti bond angles of all Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 ceramics were obtained via the X-ray diffraction Rietveld refinement technique. From these results combined with X-ray photoelectron spectroscopy analyses, it is concluded that the electron pinned defect dipole effect, which arises from the defect dipole composite structure of the ceramics, is attributed to the increase in dielectric constant and decrease in dielectric loss at intermediate frequencies. [ABSTRACT FROM AUTHOR] |
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| Items | – Name: Title Label: Title Group: Ti Data: The effect of (In3+, Ta5+) co-dopant on dielectric properties and nonlinear characteristics of Bi2/3Cu3Ti4O12 ceramics. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Yang%2C+Longhai%22">Yang, Longhai</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> ylonghai@hotmail.com</i><br /><searchLink fieldCode="AR" term="%22Chen%2C+Shijie%22">Chen, Shijie</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Gao%2C+Wenjie%22">Gao, Wenjie</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wu%2C+Fengjuan%22">Wu, Fengjuan</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhang%2C+Jingyuan%22">Zhang, Jingyuan</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhang%2C+Tao%22">Zhang, Tao</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<i> tzhang@xust.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Ceramics+International%22">Ceramics International</searchLink>. Nov2025:Part C, Vol. 51 Issue 26, p50975-50984. 10p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Dielectric+properties%22">Dielectric properties</searchLink><br /><searchLink fieldCode="DE" term="%22Nonlinear+mechanics%22">Nonlinear mechanics</searchLink><br /><searchLink fieldCode="DE" term="%22Doping+agents+%28Chemistry%29%22">Doping agents (Chemistry)</searchLink><br /><searchLink fieldCode="DE" term="%22Impedance+spectroscopy%22">Impedance spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Tantalum%22">Tantalum</searchLink><br /><searchLink fieldCode="DE" term="%22Ceramics%22">Ceramics</searchLink><br /><searchLink fieldCode="DE" term="%22Ceramic+materials%22">Ceramic materials</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Bi 2/3 Cu 3 Ti 4 O 12 , Bi 2/3 Cu 3 Ti 3.995 In 0.005 O 12 , Bi 2/3 Cu 3 Ti 3.995 Ta 0.005 O 12 , and Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 (x = 0.005, 0.01, 0.02, 0.04, and 0.08) ceramics were successfully prepared using traditional solid-phase methods. At 1 kHz, the dielectric constant and dielectric loss of all samples are 54902 and 0.3345 (Bi 2/3 Cu 3 Ti 4 O 12), 62501 and 0.3152 (Bi 2/3 Cu 3 Ti 3.995 In 0.005 O 12), 1100.2 and 0.2325 (Bi 2/3 Cu 3 Ti 3.995 Ta 0.005 O 12), 857.95 and 0.212 (Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 with x = 0.005), 3789.6 and 0.3145 (Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 with x = 0.01), 75505 and 0.1079 (Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 with x = 0.02), 80511 and 0.095 (Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 with x = 0.04), and 67487 and 0.1142 (Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 with x = 0.08), respectively. The dielectric constant gradually increases with the increase in co-doping amount, while the dielectric loss decreases. High breakdown field strength (E b = 10.37 kV/cm) and high nonlinearity coefficient (α = 5.7) are obtained for x = 0.005. The dielectric constant and dielectric loss of different sputtered electrodes were measured to confirm that electrodes have an effect across the entire frequency band investigated. The analysis of the complex impedance spectra indicates that the colossal dielectric permittivity observed in the mid-frequency range for all ceramic samples can be attributed to the internal barrier layer capacitance effect. The lattice constants, Cu–O bond lengths, Ti–O bond lengths, and Ti–O–Ti bond angles of all Bi 2/3 Cu 3 Ti 4− x (In 0.5 Ta 0.5) x O 12 ceramics were obtained via the X-ray diffraction Rietveld refinement technique. From these results combined with X-ray photoelectron spectroscopy analyses, it is concluded that the electron pinned defect dipole effect, which arises from the defect dipole composite structure of the ceramics, is attributed to the increase in dielectric constant and decrease in dielectric loss at intermediate frequencies. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Ceramics International is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.ceramint.2025.08.325 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 50975 Subjects: – SubjectFull: Dielectric properties Type: general – SubjectFull: Nonlinear mechanics Type: general – SubjectFull: Doping agents (Chemistry) Type: general – SubjectFull: Impedance spectroscopy Type: general – SubjectFull: Tantalum Type: general – SubjectFull: Ceramics Type: general – SubjectFull: Ceramic materials Type: general Titles: – TitleFull: The effect of (In3+, Ta5+) co-dopant on dielectric properties and nonlinear characteristics of Bi2/3Cu3Ti4O12 ceramics. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Yang, Longhai – PersonEntity: Name: NameFull: Chen, Shijie – PersonEntity: Name: NameFull: Gao, Wenjie – PersonEntity: Name: NameFull: Wu, Fengjuan – PersonEntity: Name: NameFull: Zhang, Jingyuan – PersonEntity: Name: NameFull: Zhang, Tao IsPartOfRelationships: – BibEntity: Dates: – D: 06 M: 11 Text: Nov2025:Part C Type: published Y: 2025 Identifiers: – Type: issn-print Value: 02728842 Numbering: – Type: volume Value: 51 – Type: issue Value: 26 Titles: – TitleFull: Ceramics International Type: main |
| ResultId | 1 |