The effect of academic breaks on undergraduate academic performance.
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| Title: | The effect of academic breaks on undergraduate academic performance. |
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| Authors: | Lenskiy, Artem1,2 (AUTHOR) artem.lenskiy@anu.edu.au, Shariat, Raad1 (AUTHOR), Seol, Soonuk1 (AUTHOR) |
| Source: | International Journal of Electrical Engineering Education. Oct2025, Vol. 62 Issue 4, p305-316. 12p. |
| Subjects: | Grade point average, Academic achievement, Koreans, Psychology of students, School vacations |
| Geographic Terms: | South Korea |
| Abstract: | Leaving school for a period of time can have significant effects on students' academic success. In this article, we analyze how taking an academic break for a different number of semesters affects students' academic performance in terms of their Grade Point Average. This study is conducted at a university in Korea by analysing academic records of 653 undergraduate students who entered the university from 1998 to 2013. In addition, 101 currently enrolled students were surveyed to collect students' opinions on the effects of academic breaks. We investigate changes in grades before and after a school leave and compare the final grades of students who had academic breaks to students who continued their studies without having any breaks during their undergraduate education.Our results indicate that students' grades improve after coming back to the university from a four or more consecutive semesters break, however their final GPAs did not statistically differ from their peers who studied continuously, this suggests that students should not be afraid of taking longer academic breaks. [ABSTRACT FROM AUTHOR] |
| Copyright of International Journal of Electrical Engineering Education is the property of Sage Publications Inc. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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