APA (7th ed.) Citation

Vonk, V., Tober, S., Leake, S. J., Rabelo Coutinho Saraiva, B., Randolph, L., Dangwal Pandey, A., . . . Stierle, A. (2025). X‐ray reflectivity from micrometre‐scaled surfaces using nanobeams. Journal of Applied Crystallography, 58(6), 1978. https://doi.org/10.1107/S1600576725008179

Chicago Style (17th ed.) Citation

Vonk, Vedran, Steffen Tober, Steven J. Leake, Breno Rabelo Coutinho Saraiva, Lisa Randolph, Arti Dangwal Pandey, Thomas F. Keller, Hans-Georg Steinrück, and Andreas Stierle. "X‐ray Reflectivity from Micrometre‐scaled Surfaces Using Nanobeams." Journal of Applied Crystallography 58, no. 6 (2025): 1978. https://doi.org/10.1107/S1600576725008179.

MLA (9th ed.) Citation

Vonk, Vedran, et al. "X‐ray Reflectivity from Micrometre‐scaled Surfaces Using Nanobeams." Journal of Applied Crystallography, vol. 58, no. 6, 2025, p. 1978, https://doi.org/10.1107/S1600576725008179.