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X‐ray reflectivity from micrometre‐scaled surfaces using nanobeams.

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Title: X‐ray reflectivity from micrometre‐scaled surfaces using nanobeams.
Authors: Vonk, Vedran1 (AUTHOR) vedran.vonk@desy.de, Tober, Steffen2 (AUTHOR), Leake, Steven J.3 (AUTHOR), Rabelo Coutinho Saraiva, Breno1 (AUTHOR), Randolph, Lisa2 (AUTHOR), Dangwal Pandey, Arti1 (AUTHOR), Keller, Thomas F.1,4 (AUTHOR), Steinrück, Hans-Georg2,5 (AUTHOR), Stierle, Andreas1,4 (AUTHOR) andreas.stierle@desy.de
Source: Journal of Applied Crystallography. Dec2025, Vol. 58 Issue 6, p1978-1985. 8p.
Subjects: X-ray reflectometry, Grazing incidence, Nanoparticles, Surfaces (Physics), Data analysis, Trajectory measurements
Abstract: Sample and diffractometer alignment for grazing‐incidence X‐ray measurements become ever more crucial once the beam and surface area of interest reach the nanometre scale. Here we show how a point of interest on a surface can be kept in the beam while measuring X‐ray reflectivity, even if it is not in the centre of rotation, either because of systematic errors or additional unwanted angle‐dependent sample movement. This can be achieved by a 1D trajectory scan varying the angle of incidence (θ), the detector angle (2θ) and the position of the sample along one axis in the scattering plane. As an example, we show the results of X‐ray reflectivity measured from a 10 × 10 µm Au island using a 90 nm beam. Data analysis is presented which considers the angle‐dependent X‐ray beam footprint illuminating both the Au island and the surrounding support. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
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PubType: Academic Journal
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  Data: X‐ray reflectivity from micrometre‐scaled surfaces using nanobeams.
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  Data: <searchLink fieldCode="AR" term="%22Vonk%2C+Vedran%22">Vonk, Vedran</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> vedran.vonk@desy.de</i><br /><searchLink fieldCode="AR" term="%22Tober%2C+Steffen%22">Tober, Steffen</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Leake%2C+Steven+J%2E%22">Leake, Steven J.</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Rabelo+Coutinho+Saraiva%2C+Breno%22">Rabelo Coutinho Saraiva, Breno</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Randolph%2C+Lisa%22">Randolph, Lisa</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Dangwal+Pandey%2C+Arti%22">Dangwal Pandey, Arti</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Keller%2C+Thomas+F%2E%22">Keller, Thomas F.</searchLink><relatesTo>1,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Steinrück%2C+Hans-Georg%22">Steinrück, Hans-Georg</searchLink><relatesTo>2,5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Stierle%2C+Andreas%22">Stierle, Andreas</searchLink><relatesTo>1,4</relatesTo> (AUTHOR)<i> andreas.stierle@desy.de</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Crystallography%22">Journal of Applied Crystallography</searchLink>. Dec2025, Vol. 58 Issue 6, p1978-1985. 8p.
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  Data: Sample and diffractometer alignment for grazing‐incidence X‐ray measurements become ever more crucial once the beam and surface area of interest reach the nanometre scale. Here we show how a point of interest on a surface can be kept in the beam while measuring X‐ray reflectivity, even if it is not in the centre of rotation, either because of systematic errors or additional unwanted angle‐dependent sample movement. This can be achieved by a 1D trajectory scan varying the angle of incidence (θ), the detector angle (2θ) and the position of the sample along one axis in the scattering plane. As an example, we show the results of X‐ray reflectivity measured from a 10 × 10 µm Au island using a 90 nm beam. Data analysis is presented which considers the angle‐dependent X‐ray beam footprint illuminating both the Au island and the surrounding support. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1107/S1600576725008179
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 8
        StartPage: 1978
    Subjects:
      – SubjectFull: X-ray reflectometry
        Type: general
      – SubjectFull: Grazing incidence
        Type: general
      – SubjectFull: Nanoparticles
        Type: general
      – SubjectFull: Surfaces (Physics)
        Type: general
      – SubjectFull: Data analysis
        Type: general
      – SubjectFull: Trajectory measurements
        Type: general
    Titles:
      – TitleFull: X‐ray reflectivity from micrometre‐scaled surfaces using nanobeams.
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            NameFull: Vonk, Vedran
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            – D: 01
              M: 12
              Text: Dec2025
              Type: published
              Y: 2025
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              Value: 58
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