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The evolution of test and measurement instruments: The increasing use of digital electronics in military operations, and the rise of artificial intelligence CAD and machine learning are pushing test technology forward.

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Title: The evolution of test and measurement instruments: The increasing use of digital electronics in military operations, and the rise of artificial intelligence CAD and machine learning are pushing test technology forward.
Authors: Whitney, Jamie
Source: Military & Aerospace Electronics. Nov/Dec2025, Vol. 36 Issue 6, p27-32. 6p.
Subjects: Artificial intelligence, Digital electronics, Digital twin, Digital computer simulation, Forecasting, Embedded computer systems, Measuring instruments
Abstract: The article explains how artificial intelligence, embedded computing, and digital simulations are transforming military and aerospace system testing from a static process into a continuous, predictive function. Topics include the integration of artificial intelligence for adaptive analysis, the use of embedded systems for realistic testing; and the role of digital twins for virtual validation and life cycle support.
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 190397176
AccessLevel: 6
PubType: Periodical
PubTypeId: serialPeriodical
PreciseRelevancyScore: 0
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  Data: The evolution of test and measurement instruments: The increasing use of digital electronics in military operations, and the rise of artificial intelligence CAD and machine learning are pushing test technology forward.
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  Data: <searchLink fieldCode="AR" term="%22Whitney%2C+Jamie%22">Whitney, Jamie</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Military+%26+Aerospace+Electronics%22">Military & Aerospace Electronics</searchLink>. Nov/Dec2025, Vol. 36 Issue 6, p27-32. 6p.
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  Data: <searchLink fieldCode="DE" term="%22Artificial+intelligence%22">Artificial intelligence</searchLink><br /><searchLink fieldCode="DE" term="%22Digital+electronics%22">Digital electronics</searchLink><br /><searchLink fieldCode="DE" term="%22Digital+twin%22">Digital twin</searchLink><br /><searchLink fieldCode="DE" term="%22Digital+computer+simulation%22">Digital computer simulation</searchLink><br /><searchLink fieldCode="DE" term="%22Forecasting%22">Forecasting</searchLink><br /><searchLink fieldCode="DE" term="%22Embedded+computer+systems%22">Embedded computer systems</searchLink><br /><searchLink fieldCode="DE" term="%22Measuring+instruments%22">Measuring instruments</searchLink>
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  Label: Abstract
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  Data: The article explains how artificial intelligence, embedded computing, and digital simulations are transforming military and aerospace system testing from a static process into a continuous, predictive function. Topics include the integration of artificial intelligence for adaptive analysis, the use of embedded systems for realistic testing; and the role of digital twins for virtual validation and life cycle support.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=190397176
RecordInfo BibRecord:
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 27
    Subjects:
      – SubjectFull: Artificial intelligence
        Type: general
      – SubjectFull: Digital electronics
        Type: general
      – SubjectFull: Digital twin
        Type: general
      – SubjectFull: Digital computer simulation
        Type: general
      – SubjectFull: Forecasting
        Type: general
      – SubjectFull: Embedded computer systems
        Type: general
      – SubjectFull: Measuring instruments
        Type: general
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      – TitleFull: The evolution of test and measurement instruments: The increasing use of digital electronics in military operations, and the rise of artificial intelligence CAD and machine learning are pushing test technology forward.
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            – D: 01
              M: 11
              Text: Nov/Dec2025
              Type: published
              Y: 2025
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