HU, J., XU, X., YANG, D., HUANG, A., KOU, G., & LI, Q. (2025). An efficient method for RISC-V memory consistency testing based on loop unrolling. Computer Engineering & Science / Jisuanji Gongcheng yu Kexue, 47(11), 1932. https://doi.org/10.3969/j.issn.1007-130X.2025.11.004
Chicago Style (17th ed.) CitationHU, Jintao, Xuezheng XU, Deheng YANG, Anwen HUANG, Guang KOU, and Qiong LI. "An Efficient Method for RISC-V Memory Consistency Testing Based on Loop Unrolling." Computer Engineering & Science / Jisuanji Gongcheng Yu Kexue 47, no. 11 (2025): 1932. https://doi.org/10.3969/j.issn.1007-130X.2025.11.004.
MLA (9th ed.) CitationHU, Jintao, et al. "An Efficient Method for RISC-V Memory Consistency Testing Based on Loop Unrolling." Computer Engineering & Science / Jisuanji Gongcheng Yu Kexue, vol. 47, no. 11, 2025, p. 1932, https://doi.org/10.3969/j.issn.1007-130X.2025.11.004.