Strong enhancement of spin waves in 2D antiferromagnetic NiO nanoflakes.
Saved in:
| Title: | Strong enhancement of spin waves in 2D antiferromagnetic NiO nanoflakes. |
|---|---|
| Authors: | An, Nan1 (AUTHOR), Zhao, Yi-Xing1 (AUTHOR), Huang, Wen-Juan1 (AUTHOR), Ding, Si-Jing2 (AUTHOR), Ma, Liang1 (AUTHOR) maliang@wit.edu.cn, Chen, Xiang-Bai1 (AUTHOR) xchen@wit.edu.cn |
| Source: | Journal of Physics D: Applied Physics. 2026, Vol. 59 Issue 1, p1-7. 7p. |
| Subjects: | Spin waves, Surface plasmon resonance, Nanoflakes, Terahertz technology, Spintronics, Temperature, Magnetic structure, Antiferromagnetism |
| Abstract: | Two-dimensional (2D) antiferromagnetic (AFM) NiO is one of the promising candidates for developing next-generation room-temperature terahertz spin wave devices. However, the spin wave signal is generally weak. In this work, we report strong enhancement of room-temperature terahertz spin waves in 2D AFM NiO nanoflakes through coupling with tiny 1–2 nm Au nanodots. We reveal that the enhancement effect is mainly correlated with localized surface plasmon resonance, but the transfer mechanism is not changed—thus producing stronger enhancement of spin waves than of phonon vibration. Furthermore, our study suggests that this strong coupling should mainly originate from localized surface plasmons with surface spin waves, indicating that 2D AFM NiO nanoflakes have a promising surface spin ordering property which would be of great interest for developing next-generation ultrafast and ultrasmall spintronic devices. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Physics D: Applied Physics is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
Be the first to leave a comment!