APA (7th ed.) Citation

Shin, Y., Moul, V., Kang, K., & Lee, B. (2026). Improved defect analysis based on atomic connectivity in polycrystalline materials. Nanotechnology, 37(19), 1. https://doi.org/10.1088/1361-6528/ae645b

Chicago Style (17th ed.) Citation

Shin, Younggak, Vichhika Moul, Keonwook Kang, and Byeongchan Lee. "Improved Defect Analysis Based on Atomic Connectivity in Polycrystalline Materials." Nanotechnology 37, no. 19 (2026): 1. https://doi.org/10.1088/1361-6528/ae645b.

MLA (9th ed.) Citation

Shin, Younggak, et al. "Improved Defect Analysis Based on Atomic Connectivity in Polycrystalline Materials." Nanotechnology, vol. 37, no. 19, 2026, p. 1, https://doi.org/10.1088/1361-6528/ae645b.