Zhao, Y., Yuan, X., Gong, L., & Huang, Z. (2026). Enhance Expert‐Semantic Feature Extraction and Combine Feature Importance and Attention Scores for Just‐in‐Time Defect Prediction and Localization. Journal of Software: Evolution & Process, 38(5), 1. https://doi.org/10.1002/smr.70118
Chicago Style (17th ed.) CitationZhao, Yu, Xinyu Yuan, Lina Gong, and Zhiqiu Huang. "Enhance Expert‐Semantic Feature Extraction and Combine Feature Importance and Attention Scores for Just‐in‐Time Defect Prediction and Localization." Journal of Software: Evolution & Process 38, no. 5 (2026): 1. https://doi.org/10.1002/smr.70118.
MLA (9th ed.) CitationZhao, Yu, et al. "Enhance Expert‐Semantic Feature Extraction and Combine Feature Importance and Attention Scores for Just‐in‐Time Defect Prediction and Localization." Journal of Software: Evolution & Process, vol. 38, no. 5, 2026, p. 1, https://doi.org/10.1002/smr.70118.