Luminescence of metal ion-activated nanophosphor supported by nanoporous sol–gel SiO2 matrices
Saved in:
| Title: | Luminescence of metal ion-activated nanophosphor supported by nanoporous sol–gel SiO |
|---|---|
| Authors: | Morita, M. morita@st.seikei.ac.jp, Iwamura, M.1, Rau, D.1, Itoh, M.1, Ishikawa, Y.1, Andoh, N.1 |
| Source: | Journal of Luminescence. Jan2007, Vol. 122-123, p879-881. 3p. |
| Subjects: | Silicon compounds, Ions, Spectrum analysis, Luminescence |
| Abstract: | Abstract: Luminescence of rare-earth ions, transition metal ions and their complexes is investigated to clarify the electronic structure, the electron–lattice interaction, energy migration processes, and nonlinear optical properties of emission centers in nanoporous sol–gel silica glasses. Optical properties of various materials are characterized by measurements of luminescence, excitation spectra, absorption spectra and lifetimes in the temperature range between 10 and 300K. The nanoporous space is examined by energy transfer in SiO2:Tb, Cr glasses and CPL properties of Tb(cyclen) complex-doped SiO2 films. The semiconductor nanocrystals SiO2/CdS: Eu3+ and D–A pair emission of SiO2/ZnS:Cu, Al, reveal quantum confinement effects in silica hosts: sol–gel SiO2 glass, films and nanotube MCM 41. For the development of new nanophosphors, surfactants, chemical stability, colors, and porous sizes are discussed in the mesoscopic system. [Copyright &y& Elsevier] |
| Copyright of Journal of Luminescence is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
Be the first to leave a comment!
