Invariants of reflectometry curves and the structural features of thin films.
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| Title: | Invariants of reflectometry curves and the structural features of thin films. |
|---|---|
| Authors: | Astaf’ev, S. B.1, Shchedrin, B. M.1,2, Yanusova, L. G.1 yanusova@ns.crys.ras.ru |
| Source: | Crystallography Reports. Jan2006, Vol. 51 Issue 1, p110-115. 6p. 4 Graphs. |
| Subjects: | Thin films, Structured techniques of electronic data processing, Electron distribution, Scattering (Physics), Radiation measurements, Autocorrelation (Statistics) |
| Abstract: | It is shown that the integral of the autocorrelation function of freestanding layered films determines the square of the mean electron density in the film cross section. Data-processing techniques are proposed to deal with the results of reflectometry measurements for films on substrates. Comparison of the autocorrelation functions calculated on the basis of the experimental curve and the model provides an opportunity to evaluate the sample quality. [ABSTRACT FROM AUTHOR] |
| Copyright of Crystallography Reports is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 23261927 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Invariants of reflectometry curves and the structural features of thin films. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Astaf’ev%2C+S%2E+B%2E%22">Astaf’ev, S. B.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Shchedrin%2C+B%2E+M%2E%22">Shchedrin, B. M.</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AR" term="%22Yanusova%2C+L%2E+G%2E%22">Yanusova, L. G.</searchLink><relatesTo>1</relatesTo><i> yanusova@ns.crys.ras.ru</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Crystallography+Reports%22">Crystallography Reports</searchLink>. Jan2006, Vol. 51 Issue 1, p110-115. 6p. 4 Graphs. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Structured+techniques+of+electronic+data+processing%22">Structured techniques of electronic data processing</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+distribution%22">Electron distribution</searchLink><br /><searchLink fieldCode="DE" term="%22Scattering+%28Physics%29%22">Scattering (Physics)</searchLink><br /><searchLink fieldCode="DE" term="%22Radiation+measurements%22">Radiation measurements</searchLink><br /><searchLink fieldCode="DE" term="%22Autocorrelation+%28Statistics%29%22">Autocorrelation (Statistics)</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: It is shown that the integral of the autocorrelation function of freestanding layered films determines the square of the mean electron density in the film cross section. Data-processing techniques are proposed to deal with the results of reflectometry measurements for films on substrates. Comparison of the autocorrelation functions calculated on the basis of the experimental curve and the model provides an opportunity to evaluate the sample quality. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Crystallography Reports is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1134/S1063774506010196 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 110 Subjects: – SubjectFull: Thin films Type: general – SubjectFull: Structured techniques of electronic data processing Type: general – SubjectFull: Electron distribution Type: general – SubjectFull: Scattering (Physics) Type: general – SubjectFull: Radiation measurements Type: general – SubjectFull: Autocorrelation (Statistics) Type: general Titles: – TitleFull: Invariants of reflectometry curves and the structural features of thin films. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Astaf’ev, S. B. – PersonEntity: Name: NameFull: Shchedrin, B. M. – PersonEntity: Name: NameFull: Yanusova, L. G. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: Jan2006 Type: published Y: 2006 Identifiers: – Type: issn-print Value: 10637745 Numbering: – Type: volume Value: 51 – Type: issue Value: 1 Titles: – TitleFull: Crystallography Reports Type: main |
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