Hiraki, Y., Nakajo, M., Takeshita, T., & Churei, H. (2000). The position of the opposite flat applicator changes the SAR and thermal distributions of the RF capacitive intracavitary hyperthermia. International Journal of Hyperthermia, 16(3), 193. https://doi.org/10.1080/026567300285222
Chicago Style (17th ed.) CitationHiraki, Y., M. Nakajo, T. Takeshita, and H. Churei. "The Position of the Opposite Flat Applicator Changes the SAR and Thermal Distributions of the RF Capacitive Intracavitary Hyperthermia." International Journal of Hyperthermia 16, no. 3 (2000): 193. https://doi.org/10.1080/026567300285222.
MLA (9th ed.) CitationHiraki, Y., et al. "The Position of the Opposite Flat Applicator Changes the SAR and Thermal Distributions of the RF Capacitive Intracavitary Hyperthermia." International Journal of Hyperthermia, vol. 16, no. 3, 2000, p. 193, https://doi.org/10.1080/026567300285222.