Development of Automatic Electronic Load Circuit for I-V Curve Measurement of Solar Cells.
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| Title: | Development of Automatic Electronic Load Circuit for I-V Curve Measurement of Solar Cells. |
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| Authors: | Singh, Abhay Kumar f2005135@bits-goa.ac.in, Philip, Abin Thomas f2005067@bits-goa.ac.in, Lal, Mohan1 mohan@mail.nplindia.ernet.in |
| Source: | CURIE Journal. 2009, Vol. 2 Issue 1, p49-56. 8p. 1 Black and White Photograph, 2 Diagrams, 1 Graph. |
| Subjects: | Solar cells, Microcontrollers, Electric circuits, Mechanical loads, Metal oxide semiconductor field-effect transistors, Electrical load |
| Abstract: | This work aims at the automated I-V characterization of solar cells using a power MOSFET based electronic load and a PIC microcontroller based interfacing circuit. The load circuit used is a dynamic electronic load that uses a power MOSFET biased in its linear region. A unity gain Op-amp is used to provide the appropriate voltage to the gate of the MOSFET so that it acts as a varying resistance, driving the current in the circuit. A microcontroller (PIC16F873) based circuit was used to measure the current and voltage levels, digitize it, and transmit them over RS232 cable using the USART protocol. An open-source cross-platform software for plotting the I-V curve was also developed. The program uses the OpenGL API to display primitives. [ABSTRACT FROM AUTHOR] |
| Copyright of CURIE Journal is the property of BITS (Birla Institute of Technology & Science) and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 39775348 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Development of Automatic Electronic Load Circuit for I-V Curve Measurement of Solar Cells. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Singh%2C+Abhay+Kumar%22">Singh, Abhay Kumar</searchLink><i> f2005135@bits-goa.ac.in</i><br /><searchLink fieldCode="AR" term="%22Philip%2C+Abin+Thomas%22">Philip, Abin Thomas</searchLink><i> f2005067@bits-goa.ac.in</i><br /><searchLink fieldCode="AR" term="%22Lal%2C+Mohan%22">Lal, Mohan</searchLink><relatesTo>1</relatesTo><i> mohan@mail.nplindia.ernet.in</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22CURIE+Journal%22">CURIE Journal</searchLink>. 2009, Vol. 2 Issue 1, p49-56. 8p. 1 Black and White Photograph, 2 Diagrams, 1 Graph. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Solar+cells%22">Solar cells</searchLink><br /><searchLink fieldCode="DE" term="%22Microcontrollers%22">Microcontrollers</searchLink><br /><searchLink fieldCode="DE" term="%22Electric+circuits%22">Electric circuits</searchLink><br /><searchLink fieldCode="DE" term="%22Mechanical+loads%22">Mechanical loads</searchLink><br /><searchLink fieldCode="DE" term="%22Metal+oxide+semiconductor+field-effect+transistors%22">Metal oxide semiconductor field-effect transistors</searchLink><br /><searchLink fieldCode="DE" term="%22Electrical+load%22">Electrical load</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: This work aims at the automated I-V characterization of solar cells using a power MOSFET based electronic load and a PIC microcontroller based interfacing circuit. The load circuit used is a dynamic electronic load that uses a power MOSFET biased in its linear region. A unity gain Op-amp is used to provide the appropriate voltage to the gate of the MOSFET so that it acts as a varying resistance, driving the current in the circuit. A microcontroller (PIC16F873) based circuit was used to measure the current and voltage levels, digitize it, and transmit them over RS232 cable using the USART protocol. An open-source cross-platform software for plotting the I-V curve was also developed. The program uses the OpenGL API to display primitives. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of CURIE Journal is the property of BITS (Birla Institute of Technology & Science) and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 49 Subjects: – SubjectFull: Solar cells Type: general – SubjectFull: Microcontrollers Type: general – SubjectFull: Electric circuits Type: general – SubjectFull: Mechanical loads Type: general – SubjectFull: Metal oxide semiconductor field-effect transistors Type: general – SubjectFull: Electrical load Type: general Titles: – TitleFull: Development of Automatic Electronic Load Circuit for I-V Curve Measurement of Solar Cells. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Singh, Abhay Kumar – PersonEntity: Name: NameFull: Philip, Abin Thomas – PersonEntity: Name: NameFull: Lal, Mohan IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: 2009 Type: published Y: 2009 Identifiers: – Type: issn-print Value: 09741305 Numbering: – Type: volume Value: 2 – Type: issue Value: 1 Titles: – TitleFull: CURIE Journal Type: main |
| ResultId | 1 |