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Validating the AMULET Microprocessors.

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Title: Validating the AMULET Microprocessors.
Authors: Furber, Steve1 sfurber@cs.man.ac.uk
Source: Computer Journal. Jan2002, Vol. 45 Issue 1, p19-26. 8p. 7 Diagrams.
Subjects: Microprocessor programming, Technological complexity, Asynchronous circuits, University of Manchester
Geographic Terms: Manchester (England), England
Abstract: The AMULET group at the University of Manchester has spent a decade designing asynchronous microprocessors of increasing performance and complexity. Getting these large designs (almost) right first time is very challenging, and any verification or validation methodologies that can be brought to bear can help improve the design quality as measured by the number and severity of bugs in the final silicon. This paper presents the methodologies used on the first three AMULET processors and describes the problems that escaped detection. The potential and need for improved tools is discussed, as are looming problems with near-future process technologies which will make right-first-time design much more difficult to achieve. [ABSTRACT FROM PUBLISHER]
Copyright of Computer Journal is the property of Oxford University Press / USA and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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  Data: The AMULET group at the University of Manchester has spent a decade designing asynchronous microprocessors of increasing performance and complexity. Getting these large designs (almost) right first time is very challenging, and any verification or validation methodologies that can be brought to bear can help improve the design quality as measured by the number and severity of bugs in the final silicon. This paper presents the methodologies used on the first three AMULET processors and describes the problems that escaped detection. The potential and need for improved tools is discussed, as are looming problems with near-future process technologies which will make right-first-time design much more difficult to achieve. [ABSTRACT FROM PUBLISHER]
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  Data: <i>Copyright of Computer Journal is the property of Oxford University Press / USA and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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