Photonic force microscope calibration by thermal noise analysis.

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Title: Photonic force microscope calibration by thermal noise analysis.
Authors: Florin, E.-L., Pralle, A., Stelzer, E.H.K., Hörber, J.K.H.
Source: Applied Physics A: Materials Science & Processing. 1998, Vol. 66 Issue 7, pS75. 1p.
Subjects: Photonics, Atomic force microscopy, Maxwell-Boltzmann distribution law, Calibration, Lateral loads
Abstract: Abstract. The threes of a photonic force microscope based on optical tweezers are determined using the Boltzmann distribution of thermally driven position fluctuations. As a fundamental method, only a minimum of information about the system is required, i.e. the solution's temperature. This calibration method provides detailed information about the trapping potential with nanometer resolution. In contrast to other calibration methods, no numerical hydrodynamic corrections are necessary. The lateral force constant of the optical trap was measured along the optical axis and found to decrease linearly by Is approximately equal to 8% micro m for a latex bead 600nm in diameter. Oscillations in the lateral force constant were found along the optical axis close to the surface. [ABSTRACT FROM AUTHOR]
Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Photonic force microscope calibration by thermal noise analysis.
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  Data: <searchLink fieldCode="AR" term="%22Florin%2C+E%2E-L%2E%22">Florin, E.-L.</searchLink><br /><searchLink fieldCode="AR" term="%22Pralle%2C+A%2E%22">Pralle, A.</searchLink><br /><searchLink fieldCode="AR" term="%22Stelzer%2C+E%2EH%2EK%2E%22">Stelzer, E.H.K.</searchLink><br /><searchLink fieldCode="AR" term="%22Hörber%2C+J%2EK%2EH%2E%22">Hörber, J.K.H.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+A%3A+Materials+Science+%26+Processing%22">Applied Physics A: Materials Science & Processing</searchLink>. 1998, Vol. 66 Issue 7, pS75. 1p.
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  Data: <searchLink fieldCode="DE" term="%22Photonics%22">Photonics</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Maxwell-Boltzmann+distribution+law%22">Maxwell-Boltzmann distribution law</searchLink><br /><searchLink fieldCode="DE" term="%22Calibration%22">Calibration</searchLink><br /><searchLink fieldCode="DE" term="%22Lateral+loads%22">Lateral loads</searchLink>
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  Label: Abstract
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  Data: Abstract. The threes of a photonic force microscope based on optical tweezers are determined using the Boltzmann distribution of thermally driven position fluctuations. As a fundamental method, only a minimum of information about the system is required, i.e. the solution's temperature. This calibration method provides detailed information about the trapping potential with nanometer resolution. In contrast to other calibration methods, no numerical hydrodynamic corrections are necessary. The lateral force constant of the optical trap was measured along the optical axis and found to decrease linearly by Is approximately equal to 8% micro m for a latex bead 600nm in diameter. Oscillations in the lateral force constant were found along the optical axis close to the surface. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s003390051103
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        Text: English
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      – SubjectFull: Photonics
        Type: general
      – SubjectFull: Atomic force microscopy
        Type: general
      – SubjectFull: Maxwell-Boltzmann distribution law
        Type: general
      – SubjectFull: Calibration
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      – SubjectFull: Lateral loads
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      – TitleFull: Photonic force microscope calibration by thermal noise analysis.
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              Text: 1998
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              Y: 1998
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