APA (7th ed.) Citation

Ishitani, T., Yamanaka, T., Inai, K., & Ohya, K. (2010). Secondary electron emission in scanning Ga ion, He ion and electron microscopes. Vacuum, 84(8), 1018. https://doi.org/10.1016/j.vacuum.2009.12.010

Chicago Style (17th ed.) Citation

Ishitani, T., T. Yamanaka, K. Inai, and K. Ohya. "Secondary Electron Emission in Scanning Ga Ion, He Ion and Electron Microscopes." Vacuum 84, no. 8 (2010): 1018. https://doi.org/10.1016/j.vacuum.2009.12.010.

MLA (9th ed.) Citation

Ishitani, T., et al. "Secondary Electron Emission in Scanning Ga Ion, He Ion and Electron Microscopes." Vacuum, vol. 84, no. 8, 2010, p. 1018, https://doi.org/10.1016/j.vacuum.2009.12.010.