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Utilizing Faulty Cores.

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Title: Utilizing Faulty Cores.
Authors: Raghavan, Karthik1 karthrags@gmail.com, Veezhinathan, Kamakoti1 kama@cse.iitm.ac.in
Source: IETE Technical Review. Sep/Oct2011, Vol. 28 Issue 5, p400-408. 9p. 2 Diagrams.
Subjects: Semiconductors, Manufacturing processes, Lithography, Production methods, Semiconductor industry
Abstract: Hard errors may be caused during the semiconductor manufacturing process, or in the field due to wearout. The incidence of such defects is increasing with the increasing complexity of lithography and reducing feature sizes. The naive solution to this problem is to discard or disable the faulty chip, but this strategy is very suboptimal. In many cases, there is scope for extracting something of value from a faulty chip. This has spurred research into recovering chips that have failed due to hard errors. This is a survey of the contributions made in this very relevant area of research, with a brief look at recent trends in detecting and diagnosing faults. [ABSTRACT FROM AUTHOR]
Copyright of IETE Technical Review is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 67254579
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Utilizing Faulty Cores.
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  Data: <searchLink fieldCode="AR" term="%22Raghavan%2C+Karthik%22">Raghavan, Karthik</searchLink><relatesTo>1</relatesTo><i> karthrags@gmail.com</i><br /><searchLink fieldCode="AR" term="%22Veezhinathan%2C+Kamakoti%22">Veezhinathan, Kamakoti</searchLink><relatesTo>1</relatesTo><i> kama@cse.iitm.ac.in</i>
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  Data: Hard errors may be caused during the semiconductor manufacturing process, or in the field due to wearout. The incidence of such defects is increasing with the increasing complexity of lithography and reducing feature sizes. The naive solution to this problem is to discard or disable the faulty chip, but this strategy is very suboptimal. In many cases, there is scope for extracting something of value from a faulty chip. This has spurred research into recovering chips that have failed due to hard errors. This is a survey of the contributions made in this very relevant area of research, with a brief look at recent trends in detecting and diagnosing faults. [ABSTRACT FROM AUTHOR]
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  Label:
  Group: Ab
  Data: <i>Copyright of IETE Technical Review is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.4103/0256-4602.85972
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      – Code: eng
        Text: English
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        PageCount: 9
        StartPage: 400
    Subjects:
      – SubjectFull: Semiconductors
        Type: general
      – SubjectFull: Manufacturing processes
        Type: general
      – SubjectFull: Lithography
        Type: general
      – SubjectFull: Production methods
        Type: general
      – SubjectFull: Semiconductor industry
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      – TitleFull: Utilizing Faulty Cores.
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            NameFull: Raghavan, Karthik
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            NameFull: Veezhinathan, Kamakoti
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              M: 09
              Text: Sep/Oct2011
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              Y: 2011
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