Lee, J., Lee, J., Kim, Y. R., & Mun, S. (2012). A Comparison Study of Friction Measurements for Chip Seal. Journal of Testing & Evaluation, 40(4), 603. https://doi.org/10.1520/jte103863
Chicago Style (17th ed.) CitationLee, Jusang, Jaejun Lee, Y. Richard Kim, and Sungho Mun. "A Comparison Study of Friction Measurements for Chip Seal." Journal of Testing & Evaluation 40, no. 4 (2012): 603. https://doi.org/10.1520/jte103863.
MLA (9th ed.) CitationLee, Jusang, et al. "A Comparison Study of Friction Measurements for Chip Seal." Journal of Testing & Evaluation, vol. 40, no. 4, 2012, p. 603, https://doi.org/10.1520/jte103863.
Warning: These citations may not always be 100% accurate.