Nucleated dewetting of thin polymer films.

Saved in:
Bibliographic Details
Title: Nucleated dewetting of thin polymer films.
Authors: Lorenz-Haas, C., Müller-Buschbaum, P., Kraus, J., Bucknall, D.G., Stamm, M.
Source: Applied Physics A: Materials Science & Processing. Dec2002 Supplement, Vol. 74 Issue 6, ps383. 1p.
Subjects: Nucleation, Polymers, Thin films
Abstract: A combination of optical microscopy and neutron reflectometry is utilized to investigate the dewetting caused by a nucleation and growth process. The model system is polystyrene (PS) on top of Si (100) with its native oxide layer. Nucleation is forced by the introduction of additional grains during the sample preparation. From neutron scattering the density profile as an averaged piece of information is gained. Optical microscopy enables the in-situ determination of lateral local structures. The growth of the hole area of individual holes is described within the Kolmogorov model. The growth exponent as a function of annealing time of all holes investigated shows a linear increase. [ABSTRACT FROM AUTHOR]
Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
Be the first to leave a comment!
You must be logged in first