Direct Measurements of Infrared Normal Spectral Emissivity of Solid Materials for High-Temperature Applications.

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Title: Direct Measurements of Infrared Normal Spectral Emissivity of Solid Materials for High-Temperature Applications.
Authors: Hatzl, S.1, Kirschner, M.1 marco.kirschner@unibw.de, Lippig, V.1, Sander, T.1, Mundt, Ch.1, Pfitzner, M.1
Source: International Journal of Thermophysics. Nov2013, Vol. 34 Issue 11, p2089-2101. 13p.
Subjects: Infrared radiation, Temperature effect, Emissivity, Silicon carbide, Surface temperature, Wavelengths
Abstract: A new facility for the measurement of the normal spectral emissivity of solid materials for high-temperature applications in the thermal steady state was developed at the Bundeswehr University of Munich. The measurements are performed under atmospheric conditions. The facility covers the temperature range between $$500\,^{\circ }\hbox {C}$$ 500 ∘ C and $$1350\,^{\circ }\hbox {C}$$ 1350 ∘ C and wavelengths between $$0.6\,\upmu \hbox {m}$$ 0.6 μ m and $$15\,\upmu \hbox {m}$$ 15 μ m . The principle of operation involves the spectral comparison of a test sample with a reference blackbody and the sample surface temperature determination with a numerical spectral ratio calculation. The optical characteristics of the blackbody and the sample surface temperature determination are discussed in detail. Furthermore, measurement results of the quasi-reference material silicon-carbide under steady-state conditions are presented to validate the measurement method. [ABSTRACT FROM AUTHOR]
Copyright of International Journal of Thermophysics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Thermophysics%22">International Journal of Thermophysics</searchLink>. Nov2013, Vol. 34 Issue 11, p2089-2101. 13p.
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  Data: <searchLink fieldCode="DE" term="%22Infrared+radiation%22">Infrared radiation</searchLink><br /><searchLink fieldCode="DE" term="%22Temperature+effect%22">Temperature effect</searchLink><br /><searchLink fieldCode="DE" term="%22Emissivity%22">Emissivity</searchLink><br /><searchLink fieldCode="DE" term="%22Silicon+carbide%22">Silicon carbide</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+temperature%22">Surface temperature</searchLink><br /><searchLink fieldCode="DE" term="%22Wavelengths%22">Wavelengths</searchLink>
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  Data: A new facility for the measurement of the normal spectral emissivity of solid materials for high-temperature applications in the thermal steady state was developed at the Bundeswehr University of Munich. The measurements are performed under atmospheric conditions. The facility covers the temperature range between $$500\,^{\circ }\hbox {C}$$ 500 ∘ C and $$1350\,^{\circ }\hbox {C}$$ 1350 ∘ C and wavelengths between $$0.6\,\upmu \hbox {m}$$ 0.6 μ m and $$15\,\upmu \hbox {m}$$ 15 μ m . The principle of operation involves the spectral comparison of a test sample with a reference blackbody and the sample surface temperature determination with a numerical spectral ratio calculation. The optical characteristics of the blackbody and the sample surface temperature determination are discussed in detail. Furthermore, measurement results of the quasi-reference material silicon-carbide under steady-state conditions are presented to validate the measurement method. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
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  Data: <i>Copyright of International Journal of Thermophysics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s10765-013-1531-y
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        Text: English
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        Type: general
      – SubjectFull: Temperature effect
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      – SubjectFull: Emissivity
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              Text: Nov2013
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