Direct Measurements of Infrared Normal Spectral Emissivity of Solid Materials for High-Temperature Applications.
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| Title: | Direct Measurements of Infrared Normal Spectral Emissivity of Solid Materials for High-Temperature Applications. |
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| Authors: | Hatzl, S.1, Kirschner, M.1 marco.kirschner@unibw.de, Lippig, V.1, Sander, T.1, Mundt, Ch.1, Pfitzner, M.1 |
| Source: | International Journal of Thermophysics. Nov2013, Vol. 34 Issue 11, p2089-2101. 13p. |
| Subjects: | Infrared radiation, Temperature effect, Emissivity, Silicon carbide, Surface temperature, Wavelengths |
| Abstract: | A new facility for the measurement of the normal spectral emissivity of solid materials for high-temperature applications in the thermal steady state was developed at the Bundeswehr University of Munich. The measurements are performed under atmospheric conditions. The facility covers the temperature range between $$500\,^{\circ }\hbox {C}$$ 500 ∘ C and $$1350\,^{\circ }\hbox {C}$$ 1350 ∘ C and wavelengths between $$0.6\,\upmu \hbox {m}$$ 0.6 μ m and $$15\,\upmu \hbox {m}$$ 15 μ m . The principle of operation involves the spectral comparison of a test sample with a reference blackbody and the sample surface temperature determination with a numerical spectral ratio calculation. The optical characteristics of the blackbody and the sample surface temperature determination are discussed in detail. Furthermore, measurement results of the quasi-reference material silicon-carbide under steady-state conditions are presented to validate the measurement method. [ABSTRACT FROM AUTHOR] |
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| Database: | Engineering Source |
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