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Extensible environment for test program generation for microprocessors.

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Title: Extensible environment for test program generation for microprocessors.
Authors: Kamkin, A.1 kamkin@ispras.ru, Sergeeva, T.1 leonsia@ispras.ru, Smolov, S.1 ssedai@ispras.ru, Tatarnikov, A.1 andrewt@ispras.ru, Chupilko, M.1 chupilko@ispras.ru
Source: Programming & Computer Software. Jan2014, Vol. 40 Issue 1, p1-9. 9p.
Subjects: Microprocessor programming, Microprocessor testing, Computers testing, Test generators, Automotive electronics, Compilers (Computer programs), Computer software
Abstract: Development of test programs and analysis of the results of their execution is the basic approach to verification of microprocessors at the system level. There is a variety of methods for the automation of test generation, starting with the generation of random code and ending with directed model-based test generation. However, there is no cure-all method. In practice, combinations of various complementary techniques are used. Unfortunately, no solution for the integration of various test generation methods into a unified environment is currently available. To test a microprocessor, verification engineers are forced to use many different test generators, which results in a number of difficulties, such as (1) the necessity to ensure the compatibility of tool configurations (in each tool, a specific description of the target microprocessor is used, which leads to duplication of information); (2) the necessity to develop utilities for integration tools (different tools have different interfaces and use different data formats). This paper describes a concept of extensible environment for test program generation for microprocessors. This environment provides a unified approach for test generation; it supports widespread test generation techniques, and can be extended by new testing tools. The proposed concept was partially implemented in MicroTESK (Microprocessor T Esting and Specification Kit). [ABSTRACT FROM AUTHOR]
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Database: Engineering Source
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Abstract:Development of test programs and analysis of the results of their execution is the basic approach to verification of microprocessors at the system level. There is a variety of methods for the automation of test generation, starting with the generation of random code and ending with directed model-based test generation. However, there is no cure-all method. In practice, combinations of various complementary techniques are used. Unfortunately, no solution for the integration of various test generation methods into a unified environment is currently available. To test a microprocessor, verification engineers are forced to use many different test generators, which results in a number of difficulties, such as (1) the necessity to ensure the compatibility of tool configurations (in each tool, a specific description of the target microprocessor is used, which leads to duplication of information); (2) the necessity to develop utilities for integration tools (different tools have different interfaces and use different data formats). This paper describes a concept of extensible environment for test program generation for microprocessors. This environment provides a unified approach for test generation; it supports widespread test generation techniques, and can be extended by new testing tools. The proposed concept was partially implemented in MicroTESK (Microprocessor T Esting and Specification Kit). [ABSTRACT FROM AUTHOR]
ISSN:03617688
DOI:10.1134/S0361768814010046