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Suitability and Applications of Total-Reflection X-Ray Fluorescence Spectrometry for Analytical Characterization of Nuclear Materials.

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Title: Suitability and Applications of Total-Reflection X-Ray Fluorescence Spectrometry for Analytical Characterization of Nuclear Materials.
Authors: Sanyal, Kaushik1,2 (AUTHOR), Dhara, Sangita1,2 (AUTHOR) sdhara@barc.gov.in
Source: Critical Reviews in Analytical Chemistry. 2025, Vol. 55 Issue 5, p799-814. 16p.
Database: Environment Complete
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  Data: Suitability and Applications of Total-Reflection X-Ray Fluorescence Spectrometry for Analytical Characterization of Nuclear Materials.
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RecordInfo BibRecord:
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        Value: 10.1080/10408347.2024.2316234
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      – Code: eng
        Text: English
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        PageCount: 16
        StartPage: 799
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      – TitleFull: Suitability and Applications of Total-Reflection X-Ray Fluorescence Spectrometry for Analytical Characterization of Nuclear Materials.
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            NameFull: Sanyal, Kaushik
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            – D: 01
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              Text: 2025
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              Y: 2025
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