Lee, H., & Vispoel, W. P. (2025). Simultaneous Detection of Cheaters and Compromised Items Using a Biclustering Approach. Journal of Educational Measurement, 62(4), 608. https://doi.org/10.1111/jedm.70004
Chicago Style (17th ed.) CitationLee, Hyeryung, and Walter P. Vispoel. "Simultaneous Detection of Cheaters and Compromised Items Using a Biclustering Approach." Journal of Educational Measurement 62, no. 4 (2025): 608. https://doi.org/10.1111/jedm.70004.
MLA (9th ed.) CitationLee, Hyeryung, and Walter P. Vispoel. "Simultaneous Detection of Cheaters and Compromised Items Using a Biclustering Approach." Journal of Educational Measurement, vol. 62, no. 4, 2025, p. 608, https://doi.org/10.1111/jedm.70004.
Warning: These citations may not always be 100% accurate.
