APA (7th ed.) Citation

Choi, Y., Park, M., Shen, Y., Zhang, M., & Kim, K. (2026). Measures of Family Process: Psychometric Properties and Invariance Testing across South Koreans, Korean Chinese, and Korean Americans. Developmental Psychology, 62(1), 254. https://doi.org/10.1037/dev0002074

Chicago Style (17th ed.) Citation

Choi, Yoonsun, Michael Park, Yishan Shen, Meng-Run Zhang, and Kihyun Kim. "Measures of Family Process: Psychometric Properties and Invariance Testing Across South Koreans, Korean Chinese, and Korean Americans." Developmental Psychology 62, no. 1 (2026): 254. https://doi.org/10.1037/dev0002074.

MLA (9th ed.) Citation

Choi, Yoonsun, et al. "Measures of Family Process: Psychometric Properties and Invariance Testing Across South Koreans, Korean Chinese, and Korean Americans." Developmental Psychology, vol. 62, no. 1, 2026, p. 254, https://doi.org/10.1037/dev0002074.