APA (7th ed.) Citation

AC, T., RE, D., & PA, M. (2008). Mapping the electrical properties of semiconductor junctions--the electron holographic approach. Scanning, 30(4), 299. https://doi.org/10.1002/sca.20125

Chicago Style (17th ed.) Citation

AC, Twitchett-Harrison, Dunin-Borkowski RE, and Midgley PA. "Mapping the Electrical Properties of Semiconductor Junctions--the Electron Holographic Approach." Scanning 30, no. 4 (2008): 299. https://doi.org/10.1002/sca.20125.

MLA (9th ed.) Citation

AC, Twitchett-Harrison, et al. "Mapping the Electrical Properties of Semiconductor Junctions--the Electron Holographic Approach." Scanning, vol. 30, no. 4, 2008, p. 299, https://doi.org/10.1002/sca.20125.