Mapping the electrical properties of semiconductor junctions--the electron holographic approach.
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| Title: | Mapping the electrical properties of semiconductor junctions--the electron holographic approach. |
|---|---|
| Authors: | Twitchett-Harrison AC; Department of Materials, Imperial College London, London, UK., Dunin-Borkowski RE, Midgley PA |
| Source: | Scanning [Scanning] 2008 Jul-Aug; Vol. 30 (4), pp. 299-309. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Hindawi in collaboration with John Wiley & Sons, Inc Country of Publication: England NLM ID: 7903371 Publication Model: Print Cited Medium: Print ISSN: 0161-0457 (Print) Linking ISSN: 01610457 NLM ISO Abbreviation: Scanning Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
| FullText | Text: Availability: 0 |
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| Header | DbId: mdl DbLabel: MEDLINE Ultimate An: 18642298 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: Mapping the electrical properties of semiconductor junctions--the electron holographic approach. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Twitchett-Harrison+AC%22">Twitchett-Harrison AC</searchLink>; Department of Materials, Imperial College London, London, UK.<br /><searchLink fieldCode="AU" term="%22Dunin-Borkowski+RE%22">Dunin-Borkowski RE</searchLink><br /><searchLink fieldCode="AU" term="%22Midgley+PA%22">Midgley PA</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%227903371%22">Scanning</searchLink> [Scanning] 2008 Jul-Aug; Vol. 30 (4), pp. 299-309. – Name: TypePub Label: Publication Type Group: TypPub Data: Journal Article – Name: TitleSource Label: Journal Info Group: Src Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Hindawi+in+collaboration+with+John+Wiley+%26+Sons%2C+Inc%22">Hindawi in collaboration with John Wiley & Sons, Inc </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>7903371 <i>Publication Model: </i>Print <i>Cited Medium: </i>Print <i>ISSN: </i>0161-0457 (Print) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2201610457%22">01610457 </searchLink><i>NLM ISO Abbreviation: </i>Scanning <i>Subsets: </i>PubMed not MEDLINE |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=18642298 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/sca.20125 Languages: – Code: eng Text: English PhysicalDescription: Pagination: StartPage: 299 Titles: – TitleFull: Mapping the electrical properties of semiconductor junctions--the electron holographic approach. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Twitchett-Harrison AC – PersonEntity: Name: NameFull: Dunin-Borkowski RE – PersonEntity: Name: NameFull: Midgley PA IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: 2008 Jul-Aug Type: published Y: 2008 Identifiers: – Type: issn-print Value: 0161-0457 Numbering: – Type: volume Value: 30 – Type: issue Value: 4 Titles: – TitleFull: Scanning Type: main |
| ResultId | 1 |