Mapping the electrical properties of semiconductor junctions--the electron holographic approach.

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Bibliographic Details
Title: Mapping the electrical properties of semiconductor junctions--the electron holographic approach.
Authors: Twitchett-Harrison AC; Department of Materials, Imperial College London, London, UK., Dunin-Borkowski RE, Midgley PA
Source: Scanning [Scanning] 2008 Jul-Aug; Vol. 30 (4), pp. 299-309.
Publication Type: Journal Article
Journal Info: Publisher: Hindawi in collaboration with John Wiley & Sons, Inc Country of Publication: England NLM ID: 7903371 Publication Model: Print Cited Medium: Print ISSN: 0161-0457 (Print) Linking ISSN: 01610457 NLM ISO Abbreviation: Scanning Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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