Beamstop-based low-background ptychography to image weakly scattering objects.

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Title: Beamstop-based low-background ptychography to image weakly scattering objects.
Authors: Reinhardt J; Deutsches Elektronen-Synchrotron DESY, D-22607 Hamburg, Germany. Electronic address: juliane.reinhardt@desy.de., Hoppe R; Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany., Hofmann G; Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, D-76131 Karlsruhe, Germany., Damsgaard CD; Center for Electron Nanoscopy and Department of Physics, Technical University of Denmark, DK-2800 Lyngby, Denmark., Patommel J; Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany., Baumbach C; Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany., Baier S; Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, D-76131 Karlsruhe, Germany., Rochet A; Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, D-76131 Karlsruhe, Germany., Grunwaldt JD; Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, D-76131 Karlsruhe, Germany., Falkenberg G; Deutsches Elektronen-Synchrotron DESY, D-22607 Hamburg, Germany., Schroer CG; Deutsches Elektronen-Synchrotron DESY, D-22607 Hamburg, Germany; Department Physik, Universität Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany.
Source: Ultramicroscopy [Ultramicroscopy] 2017 Feb; Vol. 173, pp. 52-57. Date of Electronic Publication: 2016 Nov 14.
Publication Type: Journal Article; Research Support, Non-U.S. Gov't
Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Beamstop-based low-background ptychography to image weakly scattering objects.
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  Data: <searchLink fieldCode="AU" term="%22Reinhardt+J%22">Reinhardt J</searchLink>; Deutsches Elektronen-Synchrotron DESY, D-22607 Hamburg, Germany. Electronic address: juliane.reinhardt@desy.de.<br /><searchLink fieldCode="AU" term="%22Hoppe+R%22">Hoppe R</searchLink>; Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany.<br /><searchLink fieldCode="AU" term="%22Hofmann+G%22">Hofmann G</searchLink>; Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, D-76131 Karlsruhe, Germany.<br /><searchLink fieldCode="AU" term="%22Damsgaard+CD%22">Damsgaard CD</searchLink>; Center for Electron Nanoscopy and Department of Physics, Technical University of Denmark, DK-2800 Lyngby, Denmark.<br /><searchLink fieldCode="AU" term="%22Patommel+J%22">Patommel J</searchLink>; Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany.<br /><searchLink fieldCode="AU" term="%22Baumbach+C%22">Baumbach C</searchLink>; Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany.<br /><searchLink fieldCode="AU" term="%22Baier+S%22">Baier S</searchLink>; Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, D-76131 Karlsruhe, Germany.<br /><searchLink fieldCode="AU" term="%22Rochet+A%22">Rochet A</searchLink>; Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, D-76131 Karlsruhe, Germany.<br /><searchLink fieldCode="AU" term="%22Grunwaldt+JD%22">Grunwaldt JD</searchLink>; Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, D-76131 Karlsruhe, Germany.<br /><searchLink fieldCode="AU" term="%22Falkenberg+G%22">Falkenberg G</searchLink>; Deutsches Elektronen-Synchrotron DESY, D-22607 Hamburg, Germany.<br /><searchLink fieldCode="AU" term="%22Schroer+CG%22">Schroer CG</searchLink>; Deutsches Elektronen-Synchrotron DESY, D-22607 Hamburg, Germany; Department Physik, Universität Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany.
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  Data: <searchLink fieldCode="JN" term="%227513702%22">Ultramicroscopy</searchLink> [Ultramicroscopy] 2017 Feb; Vol. 173, pp. 52-57. <i>Date of Electronic Publication: </i>2016 Nov 14.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Elsevier%22">Elsevier </searchLink><i>Country of Publication: </i>Netherlands <i>NLM ID: </i>7513702 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1879-2723 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2203043991%22">03043991 </searchLink><i>NLM ISO Abbreviation: </i>Ultramicroscopy <i>Subsets: </i>PubMed not MEDLINE
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              Text: 2017 Feb
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