The Value of Diagnostic Bilateral Intracranial Electroencephalography in Treatment-Resistant Focal Epilepsy.

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Bibliographic Details
Title: The Value of Diagnostic Bilateral Intracranial Electroencephalography in Treatment-Resistant Focal Epilepsy.
Authors: Hill TC; Department of Neurosurgery, New York University School of Medicine, New York, New York, USA., Rubin BA; Department of Neurosurgery, New York University School of Medicine, New York, New York, USA., Tyagi V; New York University School of Medicine, New York, New York, USA., Theobald J; New York University School of Medicine, New York, New York, USA., Silverberg A; Department of Neurosurgery, New York University School of Medicine, New York, New York, USA., Miceli M; Department of Neurosurgery, New York University School of Medicine, New York, New York, USA., Dugan P; Department of Neurosurgery, New York University School of Medicine, New York, New York, USA., Carlson C; Department of Neurology, Medical College of Wisconsin, Milwaukee, Wisconsin, USA., Doyle WK; Department of Neurosurgery, New York University School of Medicine, New York, New York, USA. Electronic address: wkd1@nyu.edu.
Source: World neurosurgery [World Neurosurg] 2017 Jul; Vol. 103, pp. 1-10. Date of Electronic Publication: 2017 Feb 07.
Publication Type: Journal Article
Journal Info: Publisher: Elsevier Country of Publication: United States NLM ID: 101528275 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1878-8769 (Electronic) Linking ISSN: 18788750 NLM ISO Abbreviation: World Neurosurg Subsets: MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1878-8769
DOI:10.1016/j.wneu.2017.01.093