M, A., A, P., T, D., CM, L., J, V., & KA, W. (2020). Use of spherical particles to understand conidial attachment to surfaces using atomic force microscopy. IScience, 24(1), 101962. https://doi.org/10.1016/j.isci.2020.101962
Chicago Style (17th ed.) CitationM, Amin, Preuss A, Deisenroth T, Liauw CM, Verran J, and Whitehead KA. "Use of Spherical Particles to Understand Conidial Attachment to Surfaces Using Atomic Force Microscopy." IScience 24, no. 1 (2020): 101962. https://doi.org/10.1016/j.isci.2020.101962.
MLA (9th ed.) CitationM, Amin, et al. "Use of Spherical Particles to Understand Conidial Attachment to Surfaces Using Atomic Force Microscopy." IScience, vol. 24, no. 1, 2020, p. 101962, https://doi.org/10.1016/j.isci.2020.101962.
Warning: These citations may not always be 100% accurate.