In Situ Raman Mapping of Si Island Electrodes and Stress Modeling as a Function of Lithiation and Size.

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Bibliographic Details
Title: In Situ Raman Mapping of Si Island Electrodes and Stress Modeling as a Function of Lithiation and Size.
Authors: Wang H; Department of Materials Science and Engineering & Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20740, United States., Song Y; Department of Chemical and Biomolecular Engineering, University of Maryland, College Park, Maryland 20740, United States., Ferrari VC; Department of Materials Science and Engineering & Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20740, United States., Kim NS; Department of Chemistry and Biochemistry, University of Maryland, College Park, Maryland 20740, United States., Lee SB; Department of Chemistry and Biochemistry, University of Maryland, College Park, Maryland 20740, United States., Albertus P; Department of Chemical and Biomolecular Engineering, University of Maryland, College Park, Maryland 20740, United States., Rubloff G; Department of Materials Science and Engineering & Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20740, United States., Stewart DM; Department of Materials Science and Engineering & Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20740, United States.
Source: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2023 Aug 30; Vol. 15 (34), pp. 40409-40418. Date of Electronic Publication: 2023 Aug 16.
Publication Type: Journal Article
Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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